Results 1 to 10 of about 397,310 (297)
A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy [PDF]
Beilstein Journal of Nanotechnology, 2022 Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices.
Hao Liu +5 more
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Membrane-Based Scanning Force Microscopy [PDF]
Physical Review Applied, 2021 We report the development of a scanning force microscope based on an ultra-sensitive silicon nitride membrane transducer. Our development is made possible by inverting the standard microscope geometry - in our instrument, the substrate is vibrating and the scanning tip is at rest.
Hälg, David +13 more
openaire +5 more sources
Probing Italy: A Scanning Probe Microscopy Storyline
Micro, 2023 Starting from the late 1980’s, scanning probe microscopy has progressively diffused in Italy until today. In this paper, we provide a brief account of the main historical events and a current picture of the distribution of the active groups. A survey was
Franco Dinelli +10 more
doaj +1 more source
Scanning Drop Friction Force Microscopy
Langmuir, 2022 Wetting imperfections are omnipresent on surfaces. They cause contact angle hysteresis and determine the wetting dynamics. Still, existing techniques (e.g., contact angle goniometry) are not sufficient to localize inhomogeneities and image wetting variations. We overcome these limitations through scanning drop friction force microscopy (sDoFFI).
Chirag Hinduja +6 more
openaire +3 more sources
Evaluation of the probing profile of scanning force microscopy tips [PDF]
, 1994 It is demonstrated that a high-temperature-treated (305) surface of a SrTiO3 crystal can be used to evaluate the probing profile of AFM tips routinely, to provide a means of selecting perfect tips and to evaluate possible image distortions.
Möller, M. +3 more
core +8 more sources
Atomic force microscopy in energetic materials research: A review
Energetic Materials Frontiers, 2022 Modern trends in the development of energetic materials include the various methods of particle surface modification and the widespread use of nanosized powders.
Ekaterina K. Kosareva +2 more
doaj +1 more source
ARMScope – the versatile platform for scanning probe microscopy systems
Metrology and Measurement Systems, 2020 Scanning probe microscopy (SPM) since its invention in the 80’s became very popular in examination of many different sample parameters, both in university and industry. This was the effect of bringing this technology closer to the operator.
Świadkowski Bartosz +8 more
doaj +1 more source
Dielectric Imaging of Fixed HeLa Cells by In-Liquid Scanning Dielectric Force Volume Microscopy
Nanomaterials, 2021 Mapping the dielectric properties of cells with nanoscale spatial resolution can be an important tool in nanomedicine and nanotoxicity analysis, which can complement structural and mechanical nanoscale measurements. Recently we have shown that dielectric
Martí Checa +4 more
doaj +1 more source
Noncontact lateral-force gradient measurement on Si(111)-7×7 surface with small-amplitude off-resonance atomic force microscopy [PDF]
, 2009 In this work, the authors report on a quantitative investigation of lateral-force gradient and lateral force between a tungsten tip and Si(111)-(7×7) surface using combined noncontact lateral-force microscopy and scanning tunneling microscopy ...
Atabak, Mehrdad +5 more
core +3 more sources
Sensors, 2023 Scanning electrochemical microscopy (SECM) is a versatile scanning probe technique that allows monitoring of a plethora of electrochemical reactions on a highly resolved local scale.
Andreas Karg +5 more
doaj +1 more source