Results 31 to 40 of about 2,228,604 (285)
Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
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Thin NaCl films on silver (001): island growth and work function
New Journal of Physics, 2012 The surface work function (WF) and substrate temperature dependence of the NaCl thin-film growth on Ag(001) have been studied by noncontact atomic force microscopy and Kelvin probe force microscopy.
Gregory Cabailh +2 more
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The Nobility of Second Phase Particles in S-65 Beryllium Studied by Scanning Kelvin Probe Force Microscopy [PDF]
, 2017 Scanning Kelvin probe force microscopy has been employed to examine the galvanic activity of a range of second phase particles present in beryllium that are believed to have a role in the localised corrosion of the metal.
Harvey, A, Watts, JF, Mallinson, CF
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Mechanical degradation of magnetic pulse welded Al–Fe joint in neutral salt environment
Journal of Materials Research and Technology, 2021 The urgent need in lightweight of vehicle body promoted the application of multi materials with high specific strength, and this involves the reliable welding of dissimilar materials.
Huihui Geng +4 more
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Compensating for artifacts in scanning near-field optical microscopy due to electrostatics
APL Photonics, 2021 Nanotechnology and modern materials science demand reliable local probing techniques on the nanoscopic length scale. Most commonly, scanning probe microscopy methods are applied in numerous variants and shades, for probing the different sample properties.
Tobias Nörenberg +4 more
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Metals, 2021 The variation rule of the Volta potential on deformed copper surfaces with the dislocation density is determined in this study by using electron back-scattered diffraction (EBSD) in conjunction with scanning Kelvin probe force microscopy (SKPFM).
Yang Zhang, Wei Shi, Song Xiang
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Characterization of Corrosion Interfaces by the Scanning Kelvin Probe Force Microscopy Technique [PDF]
Journal of The Electrochemical Society, 2001 A variety of interfaces relevant to corrosion processes were examined by the scanning Kelvin probe force microscopy ~SKPFM! technique in order to study the influences of various parameters on the measured potential. SKPFM measurements performed on AA2024-T3 after solution exposure showed that surface composition is not the only parameter that controls ...
Guillaumin, V. +2 more
openaire +2 more sources
Characterization of block copolymers using scanning probe microscopy
, 2006 Block copolymers have attracted lots of attention in recent years for various nanoscience and nanotechnology applications. One common technique for characterization of block copolymer thin films is scanning probe microscopy.
Wang, H, Djurisic, AB, Chan, WK, Xie, MH
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nanotech-empa/aiidalab-empa-scanning-probe: v1.6.0b1
, 2021 Materials Cloud scanning probe microscopy ...
Kristjan Eimre +3 more
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Synthesis, characterization and electrostatic properties of WS2 nanostructures
AIP Advances, 2014 We report the direct growth of atomically thin WS2 nanoplates and nanofilms on the SiO2/Si (300 nm) substrate by vapor phase deposition method without any catalyst.
Yinping Fan +6 more
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