Results 221 to 230 of about 362,376 (266)
Tailoring Functional Properties of Ti–Ni–Cu Shape Memory Alloy Thin Films for MEMS Actuators
Advanced Engineering Materials, EarlyView.A comprehensive study of critical parameters required to develop well‐performing Ti–Ni–Cu thin film shape memory alloy microactuators is provided. Materials science and device integration aspects are integrated by addressing structural and physical relationships using complementary characterization techniques as well as a practical fabrication solution
Elaheh Akbarnejad +6 more
wiley +1 more source
A Lightweight Procedural Layer for Hybrid Experimental–Computational Workflows in Materials Science
Advanced Engineering Materials, EarlyView.We unveil a prototype hybrid‐workflow framework that fuses automatedcomputation with hands‐on experiments. Built atop pyiron, a lightweight, parameterized layer translates procedure descriptions into executable manual steps, syncing instrument settings, human interventions, and data capture in real‐time today.
Steffen Brinckmann +8 more
wiley +1 more source
Influence of Test Temperature and Test Frequency on Fatigue Life of Aluminum Alloy EN AW‐2618A
Advanced Engineering Materials, EarlyView.The influence of test temperature and test frequency on the fatigue life of EN AW‐2618A is investigated. High‐cycle fatigue tests are performed at different test temperatures and frequencies on the 1000 h/230°C overaged state. Both test parameters reduce fatigue life due to time‐dependent damage mechanisms.
Ying Han +5 more
wiley +1 more source
Production of MgO/TiC Composites From MgO‐C Recyclates Using Spark Plasma Sintering
Advanced Engineering Materials, EarlyView.Using the spark plasma sintering technique, MgO/TiC composites are manufactured from recycled MgO‐C refractories stemming from the steel production that were mixed with titanium powder. This article shows, how the size of the Ti grains and their distribution in the powder mixture affect the local carbon concentration in TiC.
Jiayan Yu +3 more
wiley +1 more source
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Engineering Science and Education Journal, 1992
The article describes a range of microscopy techniques which are based on scanning a sharp tip over a surface. With such techniques it is possible both to image surfaces to atomic resolution, and to perform local property measurements to a resolution determined by the nature of the tip–surface interaction.
M.E. Welland +3 more
openaire +3 more sources
The article describes a range of microscopy techniques which are based on scanning a sharp tip over a surface. With such techniques it is possible both to image surfaces to atomic resolution, and to perform local property measurements to a resolution determined by the nature of the tip–surface interaction.
M.E. Welland +3 more
openaire +3 more sources
Analytical Chemistry, 2004
Scanning probe microscopes (SPMs) generate a highly-resolved image of the specimen by scanning its surface with a tiny mechanical, electrical, optical, thermal, or other probe. Often the tip radius of the probe is only a few nm or less. Examples for SPMs are the atomic force microscope (AFM; Sect.
Mark A, Poggi +5 more
+8 more sources
Scanning probe microscopes (SPMs) generate a highly-resolved image of the specimen by scanning its surface with a tiny mechanical, electrical, optical, thermal, or other probe. Often the tip radius of the probe is only a few nm or less. Examples for SPMs are the atomic force microscope (AFM; Sect.
Mark A, Poggi +5 more
+8 more sources
Current Opinion in Chemical Biology, 1997
During the past year, scanning probe microscopy, especially atomic force microscopy (AFM), has taken root in the biological sciences community, as is evident from the large number of publications and from the variety of specialized journals in which these papers appear.
R J, Colton +4 more
openaire +4 more sources
During the past year, scanning probe microscopy, especially atomic force microscopy (AFM), has taken root in the biological sciences community, as is evident from the large number of publications and from the variety of specialized journals in which these papers appear.
R J, Colton +4 more
openaire +4 more sources
Analytical Chemistry, 1994
The literature concerning scanning tunneling microscopy (STM) and atomic force microscopy (AFM) continues to grow. This review will cover the literature published since the last review of this kind and include the time period from December 1991 to December 1993 (AI).
D R, Louder, B A, Parkinson
openaire +2 more sources
The literature concerning scanning tunneling microscopy (STM) and atomic force microscopy (AFM) continues to grow. This review will cover the literature published since the last review of this kind and include the time period from December 1991 to December 1993 (AI).
D R, Louder, B A, Parkinson
openaire +2 more sources
Japanese Journal of Applied Physics, 2020
Presentation slides on Scanning Probe ...
openaire +2 more sources
Presentation slides on Scanning Probe ...
openaire +2 more sources