Results 21 to 30 of about 362,376 (266)

Traceably calibrated scanning Hall probe microscopy at room temperature [PDF]

open access: yesJournal of Sensors and Sensor Systems, 2020
Fabrication, characterization and comparison of gold and graphene micro- and nanoscale Hall sensors for room temperature scanning magnetic field microscopy applications are presented.
M. Gerken   +7 more
doaj   +1 more source

In situ scanning electrochemical probe microscopy for energy applications [PDF]

open access: yes, 2012
High resolution electrochemical imaging methods provide opportunities to study localized phenomena on electrode surfaces. Here, we review recent advances in scanning electrochemical microscopy (SECM) to study materials involved in (electrocatalytic ...
Lai, Stanley Chi Shing   +2 more
core   +1 more source

A cantilever-based, ultrahigh-vacuum, low-temperature scanning probe instrument for multidimensional scanning force microscopy

open access: yesBeilstein Journal of Nanotechnology, 2022
Cantilever-based atomic force microscopy (AFM) performed under ambient conditions has become an important tool to characterize new material systems as well as devices.
Hao Liu   +5 more
doaj   +1 more source

A robust, scanning quantum system for nanoscale sensing and imaging [PDF]

open access: yes, 2011
Controllable atomic-scale quantum systems hold great potential as sensitive tools for nanoscale imaging and metrology. Possible applications range from nanoscale electric and magnetic field sensing to single photon microscopy, quantum information ...
A Cuche   +42 more
core   +3 more sources

Fluorescence-based proteasome activity profiling [PDF]

open access: yes, 2012
With the proteasome emerging as a therapeutic target for cancer treatment, accurate tools for monitoring proteasome (inhibitor) activity are in demand.
Berkers, C.R.   +4 more
core   +1 more source

Scanning frequency comb microscopy—A new method in scanning probe microscopy

open access: yesAIP Advances, 2018
A method for superimposing a microwave frequency comb (MFC) on the DC tunneling current in a scanning tunneling microscope (STM) is described in which a mode-locked laser is focused on the tunneling junction. The MFC is caused by optical rectification of
M. J. Hagmann
doaj   +1 more source

Electrostatic energy calculation for the interpretation of scanning probe microscopy experiments [PDF]

open access: yes, 2000
We discuss the correct expression for the classical electrostatic energy used while analysing scanning probe microscopy (SPM) experiments if either a conducting tip or a substrate or both are used in the experiment.
Kantorovich, LN   +2 more
core   +1 more source

Scanning probe microscopy in the age of machine learning

open access: yesAPL Machine Learning, 2023
Scanning probe microscopy (SPM) has revolutionized our ability to explore the nanoscale world, enabling the imaging, manipulation, and characterization of materials at the atomic and molecular level.
Md Ashiqur Rahman Laskar, Umberto Celano
doaj   +1 more source

Controlled manipulation of oxygen vacancies using nanoscale flexoelectricity [PDF]

open access: yes, 2017
Oxygen vacancies, especially their distribution, are directly coupled to the electromagnetic properties of oxides and related emergent functionalities that have implication in device applications.
Cao, Ye   +10 more
core   +3 more sources

Tip-gating Effect in Scanning Impedance Microscopy of Nanoelectronic Devices

open access: yes, 2002
Electronic transport in semiconducting single-wall carbon nanotubes is studied by combined scanning gate microscopy and scanning impedance microscopy (SIM).
Bonnell, Dawn A.   +3 more
core   +1 more source

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