Results 41 to 50 of about 1,828 (206)
Estimating Ocean Vector Winds and Currents Using a Ka-Band Pencil-Beam Doppler Scatterometer
Remote Sensing, 2018 Ocean surface currents and winds are tightly coupled essential climate variables, and, given their short time scales, observing them at the same time and resolution is of great interest.
Ernesto Rodríguez +6 more
doaj +1 more source
Metal Surface Morphology Characterization Using Laser Scatterometry
, 1990 We have applied angle-resolved laser scatterometry to characterize the morphology of metals deposited under various conditions. Scatterometry is a rapid, noncontact and nondestructive diagnostic which yields surface statistics including rms roughness and
Y. E. Strausser +6 more
core +1 more source
Mueller based scatterometry and optical characterization of semiconductor materials [PDF]
, 2013 Scatterometry is one of the most useful metrology methods for the characterization and control of critical dimensions (CD) and the detailed topography of periodic structures found in microelectronics fabrication processes. Spectroscopic ellipsometry (SE)
Muthinti, Gangadhara Raja
core +1 more source
Journal of Geophysical Research: Oceans, Volume 131, Issue 8, August 2026.Abstract Submesoscale (1–10 km) vertical velocities at fronts enhance the exchange of particulate organic carbon (POC) and heat between the surface ocean and depth. While POC and temperature can be readily assessed in situ, direct quantification of flux remains uncertain due to the observational challenges of measuring submesoscale vertical velocities ...
Sarah E. Lang +6 more
wiley +1 more source
Institut of Marine Sciences (ICM), CSIC [PDF]
, 2010 International Ocean Vector Winds Science Team Meeting (IOVWST), Scatterometry and Ocean Vectors Winds Satellite Studies, 18-20 May 2010, Barcelona, SpainPeer ...
Palanques, Albert
core
Phase retrieval between overlapping orders in coherent Fourier scatterometry using scanning [PDF]
Journal of the European Optical Society-Rapid Publications, 2013 Non-interferometric phase retrieval from the intensity measurements in Coherent Fourier Scatterometry (CFS) is presented using a scanning focused spot.
Kumar N. +4 more
doaj +1 more source
Advanced Engineering Materials, Volume 28, Issue 13, 8 July 2026.This study presents an infrared monitoring approach for direct laser interference patterning (DLIP) combined with a convolutional neural network (CNN). Thermal emission data captured during structuring are used to predict surface topography parameters.
Lukas Olawsky +5 more
wiley +1 more source
Phi-scatterometry for integrated linewidth and process control in DRAM manufacturing
, 2022 S.470-477A cost-effective scatterometry method is presented that is suited for integrated pattern and process control and is valuable as a supplement to conventional SEMs.
Schneider, C. +4 more
core +1 more source
Compressed Learning for Nanosurface Deficiency Recognition Using Angle-Resolved Scatterometry Data
IEEE AccessNanoscale manufacturing requires high-precision surface inspection to guarantee the quality of the produced nanostructures. For production environments, angle-resolved scatterometry offers a non-invasive and in-line compatible alternative to traditional ...
Mehdi Abdollahpour +4 more
doaj +1 more source