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Fundamentals of Secondary Electron Emission
Proceedings of the IRE, 1951Secondary electron emission is of great importance to the physicist because of its bearing upon the problem of the interactions between fundamental particles and to the radio engineer because of its applications, as well as its effect, upon the operation of electronic tubes.
Martin Pomerantz, John Marshall
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1958
When the surface of a solid is bombarded with charged particles of sufficient kinetic energy, emission of electrons by the solid may be observed. This phenomenon of secondary electron emission was discovered by Austin and Starke in 1902 in a study of the reflection of electrons by metals; they observed that under certain circumstances more electrons ...
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When the surface of a solid is bombarded with charged particles of sufficient kinetic energy, emission of electrons by the solid may be observed. This phenomenon of secondary electron emission was discovered by Austin and Starke in 1902 in a study of the reflection of electrons by metals; they observed that under certain circumstances more electrons ...
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Secondary electron emission studies
Applied Surface Science, 1997Abstract Secondary-electron-emission processes under electron bombardment play an important role in the performance of a variety of electron devices. While in some devices, the anode and the grid require materials that suppress the secondary-electron-generation process, the crossed-field amplifier (CFA) is an example where the cathode requires an ...
A. Shih, J. Yater, C. Hor, R. Abrams
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1948
Publisher Summary This chapter provides a review of the present state of knowledge of secondary electron emission (SE) by electrons from metals, insulators, and complex surfaces. A great deal of early work in SE was devoted to a careful analysis of the “fine structure” of the yield curve in which numerous small humps and inflexion points between zero
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Publisher Summary This chapter provides a review of the present state of knowledge of secondary electron emission (SE) by electrons from metals, insulators, and complex surfaces. A great deal of early work in SE was devoted to a careful analysis of the “fine structure” of the yield curve in which numerous small humps and inflexion points between zero
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Emission of Slow Secondary Electrons
Nature, 1959Recent measurements indicate that the emission of some secondary electrons depends on interaction between the primary electron and ihe solid plasma as a whole. the co-operative interaction as opposed to the individual interaction of current theories. ln explaining secondnry emission, it is suggested that the injection of a primary across the boundary ...
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On the Theory of Secondary Electron Emission
Journal of the Physical Society of Japan, 1985The theory of secondary electron emission (SEE), which was proposed by Feder and Pendry, is extended. The new argument allows us to predict not only the fine structure but also all the features of SEE spectra. The secondary electron current is described as a multiplication of the fine structure part, which is easily obtained by dynamical low-energy ...
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Theory of secondary electron emission
Solid State Communications, 1978Abstract The fine structure in angle-resolved secondary electron spectra is shown to be related to the total reflectivity in low-energy electron diffraction (LEED). Theoretical results for tungsten are compared with experimental data. For non-normal emission, spin-orbit coupling is predicted to produce spin polarization of the emitted electrons.
R. Feder, J.B. Pendry
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Secondary electron emission database
Fifth IEEE International Vacuum Electronics Conference (IEEE Cat. No.04EX786), 2004We have designed a unique measurement system that will enable backscattered electron data collection in the complete (energy and angle) parameter space. Specifically, this design allows for the incident beam energy to extend from 50 eV up to 30 keV. Secondly, sample rotation allows for variation of the incident angle. Finally, and most importantly, the
J.E. Yater, A. Shih, C. Hor, B. Levush
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The Origin of Secondary Emission Electrons
Proceedings of the Physical Society. Section B, 1953A secondary electron multiplier valve is used to determine the energy necessary to liberate secondary electrons from emitting surfaces. It is found that in the case of BaO and MgO secondary electrons originate from the valence band and not from impurity centres.
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Amplification by secondary electron emission
Journal of Scientific Instruments, 1939The experimental data relating to the phenomenon of secondary electron emission from simple and complex surfaces is collected and tabulated. Simple electron multipliers with single stages of multiplication are examined and typical characteristics are shown. A brief description is given of the now obsolete dynamic type.
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