Results 1 to 10 of about 144,422 (148)

Unlocking the potential of battery technologies through Time-of-Flight Secondary Ion Mass Spectrometry [PDF]

Science and Technology of Advanced Materials
In response to the evolving demands in energy storage, the review underscores the critical need for ongoing research in battery technology, specifically centred to indispensable role of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) which aims
Prince Sharma, Gen Hasegawa, Sihao Xing, Naoaki Kuwata   +3 more
doaj   +2 more sources

Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]

Molecules
In this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
doaj   +2 more sources

Gold-Conjugated Nanobodies for Targeted Imaging Using High-Resolution Secondary Ion Mass Spectrometry [PDF]

Nanomaterials, 2021
Nanoscale imaging with the ability to identify cellular organelles and protein complexes has been a highly challenging subject in the secondary ion mass spectrometry (SIMS) of biological samples.
Paola Agüi-Gonzalez, Tal M. Dankovich, Silvio O. Rizzoli, Nhu T. N. Phan   +3 more
doaj   +2 more sources

Helium ion microscope – secondary ion mass spectrometry for geological materials [PDF]

Beilstein Journal of Nanotechnology, 2020
The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities.
Matthew R. Ball, Richard J. M. Taylor, Joshua F. Einsle, Fouzia Khanom, Christelle Guillermier, Richard J. Harrison   +5 more
doaj   +2 more sources

Molecular detection of per- and polyfluoroalkyl substances in water using time-of-flight secondary ion mass spectrometry [PDF]

Frontiers in Chemistry, 2023
Detection of per- and polyfluoroalkyl substances (PFASs) is crucial in environmental mitigation and remediation of these persistent pollutants. We demonstrate that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a viable technique to analyze
Xiao-Ying Yu, Cuiyun Yang, Jun Gao, John Xiong, Xiao Sui, Lirong Zhong, Yuchen Zhang, Jiyoung Son   +7 more
doaj   +2 more sources

Time-of-flight secondary ion mass spectrometry fragment regularity in gallium-doped zinc oxide thin films [PDF]

Scientific Reports, 2021
Time-of-flight secondary ion mass spectrometry fragment analysis remains a challenging task. The fragment appearance regularity (FAR) rule is particularly useful for two-element compounds such as ZnO.
K. G. Saw, S. R. Esa
doaj   +2 more sources

Time-of-Flight Secondary Ion Mass Spectrometry Coupled with Unsupervised Methods for Advanced Saffron Authenticity Screening [PDF]

Foods
Saffron, renowned for its aroma and flavor, is susceptible to adulteration due to its high value and demand. Current detection methods, including ISO standards, often fail to identify specific adulterants such as safflower or turmeric up to 20% (w/w ...
Elisabetta De Angelis, Omar Al-Ayoubi, Rosa Pilolli, Linda Monaci, Alice Bejjani   +4 more
doaj   +2 more sources

An algorithm for U–Pb geochronology by secondary ion mass spectrometry [PDF]

Geochronology, 2022
Secondary ion mass spectrometry (SIMS) is a widely used technique for in situ U–Pb geochronology of accessory minerals. Existing algorithms for SIMS data reduction and error propagation make a number of simplifying assumptions that degrade the precision
P. Vermeesch
doaj   +1 more source

Identification of New Psychoactive Tryptamines 4-OH-MET and 4-AcO-DMT Using High Resolution Mass Spectrometry and Nuclear Magnetic Resonance Spectroscopy [PDF]

Fayixue Zazhi, 2021
Objective To detect the uncontrolled new psychoactive tryptamines involved in drug-related cases with high resolution mass spectrometry and nuclear magnetic resonance spectroscopy.
DING Ke-ran, NI Chun-fang, HE Si-yang, et al.
doaj   +1 more source

Secondary ion mass spectrometry [PDF]

Nature Reviews Methods Primers
Secondary ion mass spectrometry (SIMS) is a technique used to analyse the composition of solid surfaces and thin films by sputtering the surface of the specimen with a primary ion beam and collecting and analysing ejected secondary ions. The technique has been applied to quality assurance in semiconductor manufacture, in forensics for enhancement of ...
Nicholas P. Lockyer, Satoka Aoyagi, John S. Fletcher, Ian S. Gilmore, Paul A. W. van der Heide, Katie L. Moore, Bonnie J. Tyler, Lu-Tao Weng   +7 more
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