Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]
MoleculesIn this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
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Secondary ion mass spectrometry imaging of Dictyostelium discoideum aggregation streams. [PDF]
PLoS ONE, 2014 High resolution imaging mass spectrometry could become a valuable tool for cell and developmental biology, but both, high spatial and mass spectral resolution are needed to enable this.
John Daniel DeBord +6 more
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An algorithm for U–Pb geochronology by secondary ion mass spectrometry [PDF]
Geochronology, 2022 Secondary ion mass spectrometry (SIMS) is a widely used technique for in situ U–Pb geochronology of accessory minerals. Existing algorithms for SIMS data reduction and error propagation make a number of simplifying assumptions that degrade the precision
P. Vermeesch
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Gold-Conjugated Nanobodies for Targeted Imaging Using High-Resolution Secondary Ion Mass Spectrometry [PDF]
Nanomaterials, 2021 Nanoscale imaging with the ability to identify cellular organelles and protein complexes has been a highly challenging subject in the secondary ion mass spectrometry (SIMS) of biological samples.
Paola Agüi-Gonzalez +3 more
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Helium ion microscope – secondary ion mass spectrometry for geological materials [PDF]
Beilstein Journal of Nanotechnology, 2020 The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities.
Matthew R. Ball +5 more
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Molecular detection of per- and polyfluoroalkyl substances in water using time-of-flight secondary ion mass spectrometry [PDF]
Frontiers in Chemistry, 2023 Detection of per- and polyfluoroalkyl substances (PFASs) is crucial in environmental mitigation and remediation of these persistent pollutants. We demonstrate that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a viable technique to analyze
Xiao-Ying Yu +7 more
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Time-of-flight secondary ion mass spectrometry fragment regularity in gallium-doped zinc oxide thin films [PDF]
Scientific Reports, 2021 Time-of-flight secondary ion mass spectrometry fragment analysis remains a challenging task. The fragment appearance regularity (FAR) rule is particularly useful for two-element compounds such as ZnO.
K. G. Saw, S. R. Esa
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Time-of-Flight Secondary Ion Mass Spectrometry Coupled with Unsupervised Methods for Advanced Saffron Authenticity Screening [PDF]
FoodsSaffron, renowned for its aroma and flavor, is susceptible to adulteration due to its high value and demand. Current detection methods, including ISO standards, often fail to identify specific adulterants such as safflower or turmeric up to 20% (w/w ...
Elisabetta De Angelis +4 more
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Science and Technology of Advanced MaterialsIn response to the evolving demands in energy storage, the review underscores the critical need for ongoing research in battery technology, specifically centred to indispensable role of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) which aims
Prince Sharma +3 more
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Time‐of‐Flight Secondary Ion Mass Spectrometry Revealing the Organocatalyst Distribution in Functionalized Silica Monoliths [PDF]
ChemistryOpenHierarchically porous monolithic silica shows promise as a carrier material for immobilized organocatalysts. Conventional analysis usually includes physisorption, infrared spectroscopy and elemental analysis, among others, to elucidate the pore space and
Raoul D. Brand +3 more
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