Cluster TOF-SIMS Imaging as a Tool for Micrometric Histology of Lipids in Tissue
Mass Spectrometry Reviews, 2014Alain Brunelle, David Touboul
exaly
Extraction of Hidden Information of ToF-SIMS Data Using Different Multivariate Analyses
Surface and Interface Analysis, 2015Tomoko Kawashima +2 more
exaly
TOF-SIMS Studies of Surface Chemistry of Minerals Subjected to Flotation Separation – A Review
Minerals Engineering, 2014exaly
19-3: Examination in Application of TOF-SIMS With MS/MS to a Degradation Analysis of OLED
Digest of Technical Papers SID International Symposium, 2019exaly
Advancements in ToF-SIMS Imaging for Life Sciences [PDF]
Frontiers in Chemistry, 2023 In the last 2 decades, Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) has gained significant prominence as a powerful imaging technique in the field of life sciences.
Feifei Jia
exaly +6 more sources
Expanding the Efficacy of Fingermark Enhancement Using ToF-SIMS [PDF]
Molecules, 2023 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been shown to enhance fingermark recovery compared to standard processes used by police forces, but there is no data to show how generally applicable the improvement is. Additionally, ToF-SIMS
Deborah Charlton +4 more
doaj +3 more sources
Norm-SVR for the Enhancement of Single-Cell Metabolomic Stability in ToF-SIMS [PDF]
MetabolitesPurpose: Data stability is a critical factor in Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) single-cell analysis. However, various factors, such as sample processing, instrument condition, and data acquisition, can introduce uncertainties ...
Mingru Liu +5 more
doaj +2 more sources
In situ Chemical Profiling and Imaging of Cultured and Natural Cordyceps sinensis by TOF-SIMS [PDF]
Frontiers in Chemistry, 2022 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for ...
Qian-Bao Liu +9 more
doaj +2 more sources
Depth Correction of TOF-SIMS Depth Profiling Images Using the Total Ion Count Images [PDF]
BiomoleculesDepth profiling time of flight secondary ion mass spectrometry (TOF-SIMS) enables imaging the distributions of unlabeled metabolites within cells. When depth profiling TOF-SIMS is performed on intact cells, the 3D renderings produced by stacking and ...
Melanie A. Brunet +2 more
doaj +2 more sources
ToF-SIMS spectral data analysis of Paenibacillus sp. 300A biofilms and planktonic cellsIEEE DataPort [PDF]
Data in BriefAnalysis of bacterial biofilms is particularly challenging and important with diverse applications from systems biology to biotechnology. Among the variety of techniques that have been applied, time-of-flight secondary ion mass spectrometry (ToF-SIMS ...
Gabriel D. Parker +3 more
doaj +2 more sources