Results 11 to 20 of about 121,814 (291)
ToF-SIMS : methods & applications [PDF]
, 2022 Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a powerful tool for investigating the elemental and molecular variation across surfaces and through sub-surface layers.
Prakash, Aruna +3 more
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ToF-SIMS evaluation of PEG-related mass peaks and applications in PEG detection in cosmetic products [PDF]
Scientific ReportsPolyethylene glycols (PEGs) are used in industrial, medical, health care, and personal care applications. The cycling and disposal of synthetic polymers like PEGs pose significant environmental concerns.
Yanjie Shen, Jiyoung Son, Xiao-Ying Yu
doaj +2 more sources
Characterization of the Micro‐Morphology and Compositional Distribution of Chang'e‐5 Lunar Soil Mineral Surfaces Using TOF‐SIMS [PDF]
Advanced ScienceThe lunar soil samples returned by China's Chang'e‐5 (CE‐5) contain valuable information on geological evolutions on the Moon. Herein, by employing high‐resolution time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS), five rock chip samples from the
Tinglu Song +10 more
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Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]
MoleculesIn this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
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Application of Random Forests in ToF-SIMS Data [PDF]
Procedia Computer Science, 2020 Surface analysis techniques are particularly important in the field of materials science, which help researchers to understand the mechanism behind complex chemical reactions and study the properties of different materials. Time-of-flight secondary ion mass spectrometry (ToF-SIMS), a highly sensitive surface analysis technique, allows the reliable ...
Yinghan Zhao +4 more
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TOF-SIMS in Cosmochemistry [PDF]
, 2004 Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a decade ago. Major advantages of TOF-SIMS compared to other ion microprobe techniques are (a) parallel detection of all secondary ions with one polarity in a single measurement both polarities in subsequent analyses, (b) high lateral resolution, (c ...
Stephan, T. (Thomas)
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Spectroscopy in the analysis of bacterial and eukaryotic cell footprints on implant surfaces [PDF]
European Cells & Materials, 2012 We tested the suitability of two spectroscopic methods, x-ray photoelectron spectroscopy (XPS) and time of flight secondary ion mass spectrometry (ToF-SIMS), in the recognition of bacterial and eukaryotic cell footprints on implant surfaces.
E Kaivosoja +4 more
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TOF-SIMS (Michellod et al. 2023) [PDF]
, 2023 PFA-fixed Olavius algarvensis specimens were embedded in paraffin and cut into 4 µm thick sections. The sections were de-waxed, wrap in aluminium foil and stored in a dessicator until TOF-SIMS analysis.
Manuel Liebeke (426857) +9 more
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TOF-SIMS: Accurate mass scale calibration [PDF]
Journal of the American Society for Mass Spectrometry, 2006 A study is presented of the factors affecting the calibration of the mass scale in time-of-flight secondary ion mass spectrometry (TOF-SIMS). At the present time, TOF-SIMS analysts using local calibration procedures achieve a rather poor relative mass accuracy of only 150 ppm for large molecules (647 u) whereas for smaller fragments of
Green, F.M., Gilmore, I.S., Seah, M.P.
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ToF-SIMS ion images of Messel fish fossil ganoid scale 2 (Fig 1C and 1D). [PDF]
, 2022 A) Micrograph of ToF-SIMS analysis area on ganoid scale 2. High spatial resolution ToF-SIMS ion images of B) sum of porphyrin peaks (m/z 441, 455, 469 and 483) C) Fe+, D) FeC2N2-, E) Ni+, F) NiC2N2-, G) sum of PAHs (m/z 77, 91, 139, 141, 165), H) Al+, I)
Anna Neubeck (3590630) +2 more
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