Results 21 to 30 of about 164,775 (283)
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis [PDF]
Nanoparticles have gained increasing attention in recent years due to their potential and application in different fields including medicine, cosmetics, chemistry, and their potential to enable advanced materials. To effectively understand and regulate the physico-chemical properties and potential adverse effects of nanoparticles, validated measurement
Bennet, Francesca +7 more
openaire +2 more sources
Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry [PDF]
This study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface.
de Puit, Marcel +18 more
core +1 more source
TOF-SIMS (Michellod et al. 2023)
PFA-fixed Olavius algarvensis specimens were embedded in paraffin and cut into 4 µm thick sections. The sections were de-waxed, wrap in aluminium foil and stored in a dessicator until TOF-SIMS analysis.
Manuel Liebeke (426857) +9 more
core +1 more source
BackgroundUnderstanding the spatial distribution of active compounds can effectively evaluate the quality of decoction pieces of traditional Chinese medicine (TCM).
Fan He +12 more
doaj +1 more source
Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) is an imaging‐based analytical technique that can characterize the surfaces of biomaterials.
Kookrae Cho +6 more
doaj +1 more source
Determining the order of deposition of natural latent fingerprints and laser printed ink using chemical mapping with secondary ion mass spectrometry [PDF]
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) chemical mapping was used to investigate the order of deposition of natural latent fingerprints and laser printed ink on paper.
Jesus Ojeda Ledo +6 more
core +1 more source
Applications of ToF-SIMS in Surface Chemistry Analysis of Lignocellulosic Biomass: A Review
Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass.
Hong Yan Mou, Shubin Wu, Pedro Fardim
doaj +1 more source
The self-assembled monolayers (SAMs) of organosilanes formed on an oxide substrate are thought to have a polymerized –Si–O–Si– network due to the homocondensation of silanols of hydrolyzed silane headgroups, which is the most significant difference in ...
Heng-Yong Nie +1 more
doaj +1 more source
Analysis of COSIMA spectra: Bayesian approach [PDF]
We describe the use of Bayesian analysis methods applied to time-of-flight secondary ion mass spectrometer (TOF-SIMS) spectra. The method is applied to the COmetary Secondary Ion Mass Analyzer (COSIMA) TOF-SIMS mass spectra where the analysis can be ...
H. J. Lehto +8 more
doaj +1 more source
ToF-SIMS and Machine Learning for Single-Pixel Molecular Discrimination of an Acrylate Polymer Microarray. [PDF]
Combinatorial approaches to materials discovery offer promising potential for the rapid development of novel polymer systems. Polymer microarrays enable the high-throughput comparison of material physical and chemical propertiessuch as surface chemistry
Gardner W +6 more
europepmc +2 more sources

