Results 21 to 30 of about 121,814 (291)

Investigation of inter- and intra-tumoral heterogeneity of glioblastoma using TOF-SIMS [PDF]

, 2019
Here, we for the first time applied TOF-SIMS (Time-of-flight secondary ion mass spectrometry) to study glioma tumors and cells with 800 nm resolution.
Ksenia Anufrieva (5461703)
core   +3 more sources

Molecular detection of per- and polyfluoroalkyl substances in water using time-of-flight secondary ion mass spectrometry

Frontiers in Chemistry, 2023
Detection of per- and polyfluoroalkyl substances (PFASs) is crucial in environmental mitigation and remediation of these persistent pollutants. We demonstrate that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a viable technique to analyze
Xiao-Ying Yu, Cuiyun Yang, Jun Gao, John Xiong, Xiao Sui, Lirong Zhong, Yuchen Zhang, Jiyoung Son   +7 more
doaj   +1 more source

ToF-SIMS ion and SEM images of Messel fish fossil bone fragment (Fig 1E and 1F). [PDF]

, 2022
A) Micrograph of ToF-SIMS analysis area on bone fragment. High spatial resolution ToF-SIMS ion images of B) sum of porphyrin peaks (m/z 441, 455, 469 and 483), C) Fe+, D) Ni+, E) sum of PAHs (m/z 77,91, 139, 141, 165), F) Al+, and G) Si+. H) SEM image of
Anna Neubeck (3590630), Sandra Siljeström (5613821), Andrew Steele (2012278)   +2 more
core   +1 more source

ToF-SIMS and Machine Learning for Single-Pixel Molecular Discrimination of an Acrylate Polymer Microarray. [PDF]

Anal Chem, 2020
Combinatorial approaches to materials discovery offer promising potential for the rapid development of novel polymer systems. Polymer microarrays enable the high-throughput comparison of material physical and chemical propertiessuch as surface chemistry
Gardner W, Hook AL, Alexander MR, Ballabio D, Cutts SM, Muir BW, Pigram PJ.   +6 more
europepmc   +2 more sources

Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry [PDF]

, 2014
This study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface.
de Puit, Marcel, Jones, Benjamin, Ismail, Mahado, Reynolds, Alan, Ismail, M, Jones, BJ, Doodkorte, Lisette, Attard-Montalto, N, Ojeda, Jesus J., Doodkorte, L, Bailey, Melanie, Reynolds, A, Jesus Ojeda Ledo, Bailey, M, De Puit, M, Jones, B J, Attard-Montalto, Nicola, Ojeda, JJ, Ojeda, J J   +18 more
core   +1 more source

The localization of the alkaloids in Coptis chinensis rhizome by time-of-flight secondary ion mass spectrometry

Frontiers in Plant Science, 2022
BackgroundUnderstanding the spatial distribution of active compounds can effectively evaluate the quality of decoction pieces of traditional Chinese medicine (TCM).
Fan He, Yu-Feng Huang, Wei Dai, Xian-You Qu, Jing-Guang Lu, Chi-Chou Lao, Wen-Hui Luo, Dong-Mei Sun, Mei Wei, Sheng-Yuan Xiao, Ying Xie, Liang Liu, Hua Zhou   +12 more
doaj   +1 more source

Screening of important metabolites and KRAS genotypes in colon cancer using secondary ion mass spectrometry

Bioengineering & Translational Medicine, 2021
Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) is an imaging‐based analytical technique that can characterize the surfaces of biomaterials.
Kookrae Cho, Eun‐Sook Choi, Sung Young Lee, Jung‐Hee Kim, Dae Won Moon, Jong‐Wuk Son, Eunjoo Kim   +6 more
doaj   +1 more source

Preparation of Nanoparticles for ToF-SIMS and XPS Analysis [PDF]

Journal of Visualized Experiments, 2020
Nanoparticles have gained increasing attention in recent years due to their potential and application in different fields including medicine, cosmetics, chemistry, and their potential to enable advanced materials. To effectively understand and regulate the physico-chemical properties and potential adverse effects of nanoparticles, validated measurement
Bennet, Francesca, Müller, Anja, Radnik, Jörg, Hachenberger, Yves, Jungnickel, Harald, Laux, Peter, Luch, Andreas, Tentschert, Jutta   +7 more
openaire   +2 more sources

Determining the order of deposition of natural latent fingerprints and laser printed ink using chemical mapping with secondary ion mass spectrometry [PDF]

, 2013
Time-of-flight secondary ion mass spectrometry (ToF-SIMS) chemical mapping was used to investigate the order of deposition of natural latent fingerprints and laser printed ink on paper.
Jesus Ojeda Ledo, Jones, Benjamin, Jones, B J, Ojeda, Jesus J, Attard Montalto, N, Attard Montalto, Nicola, Ojeda, J J   +6 more
core   +1 more source

Applications of ToF-SIMS in Surface Chemistry Analysis of Lignocellulosic Biomass: A Review

BioResources, 2016
Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass.
Hong Yan Mou, Shubin Wu, Pedro Fardim
doaj   +1 more source