Results 21 to 30 of about 175,734 (285)
TOF-SIMS: Accurate mass scale calibration [PDF]
A study is presented of the factors affecting the calibration of the mass scale in time-of-flight secondary ion mass spectrometry (TOF-SIMS). At the present time, TOF-SIMS analysts using local calibration procedures achieve a rather poor relative mass accuracy of only 150 ppm for large molecules (647 u) whereas for smaller fragments of
Green, F.M., Gilmore, I.S., Seah, M.P.
openaire +2 more sources
Detection of per- and polyfluoroalkyl substances (PFASs) is crucial in environmental mitigation and remediation of these persistent pollutants. We demonstrate that time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a viable technique to analyze
Xiao-Ying Yu +7 more
doaj +1 more source
Preparation of Nanoparticles for ToF-SIMS and XPS Analysis [PDF]
Nanoparticles have gained increasing attention in recent years due to their potential and application in different fields including medicine, cosmetics, chemistry, and their potential to enable advanced materials. To effectively understand and regulate the physico-chemical properties and potential adverse effects of nanoparticles, validated measurement
Bennet, Francesca +7 more
openaire +2 more sources
Investigation of inter- and intra-tumoral heterogeneity of glioblastoma using TOF-SIMS
Here, we for the first time applied TOF-SIMS (Time-of-flight secondary ion mass spectrometry) to study glioma tumors and cells with 800 nm resolution.
Ksenia Anufrieva (5461703)
core +3 more sources
Investigation of Inter- and Intratumoral Heterogeneity of Glioblastoma Using TOF-SIMS [PDF]
Ksenia Anufrieva +2 more
exaly +2 more sources
Determining the chronology of deposition of natural fingermarks and inks on paper using secondary ion mass spectrometry [PDF]
This study thoroughly explores the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) for determining the deposition sequence of fingermarks and ink on a porous paper surface.
de Puit, Marcel +18 more
core +1 more source
BackgroundUnderstanding the spatial distribution of active compounds can effectively evaluate the quality of decoction pieces of traditional Chinese medicine (TCM).
Fan He +12 more
doaj +1 more source
Time‐of‐flight secondary ion mass spectrometry (TOF‐SIMS) is an imaging‐based analytical technique that can characterize the surfaces of biomaterials.
Kookrae Cho +6 more
doaj +1 more source
Sample description, Tof-SIMS experimental conditions, ToF-SIMS, ATR-FTIR and XRD complementary results and PCA on ToF-SIMS ...
Laurent Houssiau (1985005) +6 more
core +1 more source
Applications of ToF-SIMS in Surface Chemistry Analysis of Lignocellulosic Biomass: A Review
Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass.
Hong Yan Mou, Shubin Wu, Pedro Fardim
doaj +1 more source

