Results 31 to 40 of about 20,232 (192)
The increasing use of nanoparticles (NP) in commercial products requires elaborated techniques to detect NP in the tissue of exposed organisms. However, due to the low amount of material, the detection and exact localization of NP within tissue sections ...
Lothar Veith +8 more
doaj +1 more source
Tribochimie du laminage à froid : étude par ToF-SIMS de la chimisorption sur la tôle des additifs du lubrifiant : Tribologie de la mise en forme des métaux [PDF]
International audienceLa chimisorption des additifs de lubrifiant de laminage à froid sur un acier et un alliage d'aluminium est étudiée par spectrométrie de masse ToF-SIMS.
Combarieu, Robert +5 more
core +3 more sources
For the analysis of thin films, with high aspect ratio (HAR) structures, time-of-flight secondary ion mass spectrometry (ToF-SIMS) overcomes several challenges in comparison to other frequently used techniques such as electron microscopy.
Alireza M. Kia +6 more
doaj +1 more source
Objectives To evaluate intermediate treatments between sodium hypochlorite and chlorhexidine gluconate irrigations for the prevention of a toxic brown precipitate in root canal therapy.
Vashti Bueso +5 more
doaj +1 more source
On the transport of alkali ions through polymeric mold compounds and polyelectrolyte membranes. [PDF]
The aim of this work is the attempt in understanding ion transport properties across structured materials such as polyelectrolyte multilayers (PEMs) and highly filled epoxy resins used as an encapsulant, i.e. mold compounds.
Motta, Viviana
core +1 more source
Evidence for electron transfer between graphene and non‐covalently bound π‐systems [PDF]
Hybridizing graphene and molecules possess a high potential for developing materials for new applications. However, new methods to characterize such hybrids must be developed.
Brülls, Steffen M. +9 more
core +2 more sources
Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer
In recent years, time of flight-secondary ion mass spectrometer (ToF-SIMS) has been widely employed to acquire surface information of materials. Here, we investigated the alloy surface by combining the mass spectra and 2D mapping images of ToF-SIMS.
Tinglu Song +6 more
doaj +1 more source
Origin of passivation in hole-selective transition metal oxides for crystalline silicon heterojunction solar cells [PDF]
Transition metal oxides (TMOs) have recently demonstrated to be a good alternative to boron/phosphorous doped layers in crystalline silicon heterojunction solar cells.
Alcubilla González, Ramón +3 more
core +2 more sources
Tandem GCIB-ToF-SIMS and GCIB-XPS analyses of the 2-mercaptobenzothiazole on brass
Surface analysis of 2-mercaptobenzothiazole (MBTH) adsorbed on brass from 3 wt.% NaCl solution was performed by means of X-ray photoelectron spectroscopy and tandem (MS/MS) time-of-flight secondary ion mass spectrometry (ToF-SIMS).
Matjaž Finšgar
doaj +1 more source
Application of Random Forests in ToF-SIMS Data
Surface analysis techniques are particularly important in the field of materials science, which help researchers to understand the mechanism behind complex chemical reactions and study the properties of different materials. Time-of-flight secondary ion mass spectrometry (ToF-SIMS), a highly sensitive surface analysis technique, allows the reliable ...
Yinghan Zhao +4 more
openaire +3 more sources

