Reducing the matrix effect in mass spectral imaging of biofilms using flow-cell culture
Frontiers in Chemistry, 2023 The interactions between soil microorganisms and soil minerals play a crucial role in the formation and evolution of minerals and the stability of soil aggregates.
Yuchen Zhang +6 more
doaj +1 more source
Using imaging ToF-SIMS data to determine the cell wall thickness of fibers in wood [PDF]
, 2014 Here, we demonstrate the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging data for estimation of cell wall thickness in wood samples.
Kiet, H. A. T. +18 more
core +1 more source
Investigation of planktonic foraminifera with ToF‐SIMS [PDF]
Surface and Interface Analysis, 2002 Abstract Various oceanic sediment properties deliver useful information for reconstructing environmental parameters of the past. Those properties that are closely related to environmental parameters are called ‘proxies’. They are measurable descriptors for desired (but unobservable) variables.
C. Crone +4 more
openaire +1 more source
ToF-SIMS and Principal Component Analysis Investigation of Denatured, Surface-Adsorbed Antibodies [PDF]
, 2016 Antibody denaturation at solid–liquid interfaces plays an important role in the sensitivity of protein assays such as enzyme-linked immunosorbent assays (ELISAs). Surface immobilized antibodies must maintain their native state, with their antigen binding
Nicholas G. Welch (2998395) +4 more
core +1 more source
Compositional, ultrastructural and nanotechnological characterization of the SMA strain of Saccharomyces pastorianus: Towards a more complete fermentation yeast cell analysis. [PDF]
PLoS ONE, 2018 Nano scanning Auger microscopy (NanoSAM) and time-of-flight secondary ion mass spectrometry (TOF-SIMS) have been used in materials science research for some time, but NanoSAM, in particular, has only recently been applied to biological specimens.
Greg Potter +7 more
doaj +1 more source
ToF-SIMS in battery research: Advantages, limitations, and best practices [PDF]
, 2023 Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful analytical technique whose application has great potential for battery research and that today is not used at its full potential.
Lombardo, Teo +6 more
core +2 more sources
Letter from Sam Sims, Pontiac, Illinois, to Clara P. Sims, Elgin, Illinois, May 26, 1909 [PDF]
, 1909 One typewritten letter from Sam Sims of Pontiac, Illinois, to his wife Clara, who is away on a visit in Elgin, Illinois.
Sims, Sam
core
ToF-SIMS Characterization of Nanostructured ZrO2 Coatings Applied to Near Equiatomic Ni-Ti Alloy [PDF]
, 2019 The ToF-SIMS technique was applied to analyze thin ZrO2 coatings deposited on the surface of a Ni-Ti alloy. Due to its nanostructured nature, these films are difficult to characterize by conventional techniques.
Jéssica Dornelas Silva (4655116) +6 more
core +1 more source
Richard-Sims/Sims_2023_OceanSODA-UNEXE: v1.0.0 [PDF]
, 2023 This code relates to Sims, R. P., Holding, T. M., Land, P. E., Piolle, J.-F., Green, H. L., and Shutler, J. D.: OceanSODA-UNEXE: A multi-year gridded Amazon and Congo River outflow surface ocean carbonate system dataset, Earth Syst. Sci.
oceanflux-ghg, Richard Sims
core +1 more source
Advanced Functional Materials, EarlyView.Oxygen‐tunnel (OT) indium tin oxide (ITO) vertical channel transistors (VCTs) enable reliable, high‐density gain‐cell memory for monolithic 3D integration. A sandwiched SiN/SiO2/SiN OT stack selectively regulates oxygen transport, suppressing parasitic electrode oxidation while stabilizing channel oxygen vacancies, thereby suppressing carrier injection
Hyeonho Gu +17 more
wiley +1 more source