Results 51 to 60 of about 164,775 (283)

Using imaging ToF-SIMS data to determine the cell wall thickness of fibers in wood [PDF]

, 2014
Here, we demonstrate the use of time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging data for estimation of cell wall thickness in wood samples.
Kiet, H. A. T., Per Malmberg, Linh Tran, Hanrieder, Jörg, Jörg Hanrieder, Viet Mai Hoang, Hanrieder, J\uf6rg, Ewing, Andrew G, Tran, L., Lorenz Gerber, Hoang, V. M., Hanrieder, Jörg,, Hoang Anh Tuan Kiet, Andrew Ewing, Malmberg, Per, Gerber, Lorenz, Ewing, Andrew, Ewing, Andrew G,, Malmberg, Per,   +18 more
core   +1 more source

Cryogenic Deformation Behavior of TiAl and Insights Into Embrittlement After High‐Temperature Exposure Combined With Secondary Ion Mass Spectroscopy of Near Surface Chemistry

Advanced Engineering Materials, EarlyView.
Near‐surface deuterium enrichment profiles for different microstructural types of TiAl after exposure at 700 °C in a heavy water‐containing environment. The deuterium levels are significantly higher than expected from natural occurrence, indicating that the heavy water dissociated during the exposure treatment and entered the specimens.
Jonathan D. H. Paul, Alexander Welle, Dirk Matthiessen, Michael Oehring, Fritz Appel, Florian Pyczak   +5 more
wiley   +1 more source

Identification and imaging of lipids in tissues using TOF-SIMS [PDF]

, 2008
Introduction: Normal lipid metabolism in the adipose tissue, skeletal muscle and aortic wall is important for the physiological function of these tissues.
Magnusson, Ylva
core   +1 more source

Electrode and Microstructure Dependence of Oxygen Diffusion in Ferroelectric Hafnium Zirconium Oxide Thin Films

Advanced Functional Materials, EarlyView.
Significant nanoscale oxygen diffusion coefficient variations are measured in ferroelectric hafnium zirconium oxide films with grain boundaries and electrode interfaces exhibiting values 104 times larger than the grain cores. Overall coefficients are 10X larger for films prepared with metal nitride electrodes compared to refractory metals. New insights
Liron Shvilberg, Thomas W. Pfeifer, Chuanzhen Zhou, Yong Kyu Choi, Duk‐Hyun Choe, Patrick E. Hopkins, Jon F. Ihlefeld   +6 more
wiley   +1 more source

Simultaneous Enhancement of Performance and Stability in Dual‐Gate a‐IGZO Thin‐Film Transistors via Single‐Step Laser Annealing for Capacitor‐Less DRAM

Advanced Functional Materials, EarlyView.
A single‐step laser annealing strategy is presented for dual‐gate a‐IGZO TFTs. The steep thermal gradient induces graded oxygen doping in the channel and simultaneous WOx removal at the contacts, enabling concurrent interface and contact engineering.
Sihyeon Kwon, Junil Kim, Geuntae Park, Minseok Kim, Woohyun Hwang, Wanki Kim, Daewon Ha, Byeongmoon Lee, Jae Eun Jang, Hyuk‐Jun Kwon   +9 more
wiley   +1 more source

Visualization of solute diffusion into cell walls in solution-impregnated wood under varying relative humidity using time-of-flight secondary ion mass spectrometry

Scientific Reports, 2018
The purpose of the present study is to clarify the diffusion of non-volatile substances into cell walls during the conditioning procedure under varying relative humidities (RH).
Peiming Zheng, Dan Aoki, Masako Seki, Tsunehisa Miki, Soichi Tanaka, Kozo Kanayama, Yasuyuki Matsushita, Kazuhiko Fukushima   +7 more
doaj   +1 more source

TOF-SIMS and AFM analysis of pH effect on the interfacial films on η-phase in aqueous salt solutions

Applied Surface Science Advances, 2023
The pH effect on the surface and interfacial films on η-phase (MgZn2) in aqueous solutions under acidic, neutral, and alkaline conditions has been evaluated using time of flight-secondary ion spectroscopy (TOF-SIMS), Atomic force microscopy (AFM) and ...
Alexander I. Ikeuba
doaj   +1 more source

Memristive‐Gated RC‐Delay Synaptic Transistors for Time‐Encoded Analog in‐Memory Computing

Advanced Functional Materials, EarlyView.
A Memristive‐Gated Transistor for Time‐Encoded Analog In‐Memory Computing — By exploiting the RC delay of a self‐rectifying interface‐type memristor, nonlinear I–V distortion is structurally bypassed, enabling 3‐bit nonvolatile memory, spike‐timing‐based analog encoding, and hardware‐calibrated reservoir‐computing validation within a unified device ...
Yun‐Seo Shin, Eunjoo Yoo, Ki‐Hoon Son, Hyun‐Sik Kim, Dae‐Hee Han, Jeong Hyeon Son, Seung Hwan Lee, Hong‐Sub Lee   +7 more
wiley   +1 more source

Results of Inter-laboratory Tests among SASJ on Accurate Mass Scale Calibration of ToF-SIMS [PDF]

, 2011
To evaluate the present errors in the calibration of the mass scale of time-of-flight secondary ion mass spectrometry (ToF-SIMS) in the practical field of Japanese industries, ToF-SIMS Working Group (WG) of Surface Analysis Society of Japan (SASJ ...
Group, Shinya Otomo, Yoshimi Abe, Tof-Sims Working, Hiroto Itoh   +4 more
core  

ToF-SIMS spectra of ganoid scales and bone fragments of Messel fossil fish.

, 2022
Positive ToF-SIMS spectra (m/z 410–530) of A) area indicated by green dotted box on ganoid scale 1 with gray-brown film in Fig 1B, B) area indicated by green dotted box on fish bone fragment in Fig 1F, and C) area indicated by green dotted box in ganoid ...
Anna Neubeck (3590630), Sandra Siljeström (5613821), Andrew Steele (2012278)   +2 more
core   +1 more source