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Secondary ion mass spectrometry [PDF]

open access: yesNature Reviews Methods Primers
Citation: 'secondary-ion mass spectrometry' in the IUPAC Compendium of Chemical Terminology, 5th ed.; International Union of Pure and Applied Chemistry; 2025. Online version 5.0.0, 2025. 10.1351/goldbook.09192 • License: The IUPAC Gold Book is licensed under Creative Commons Attribution-ShareAlike CC BY-SA 4.0 International for ...
Lu-Tao Weng   +2 more
exaly   +6 more sources

Secondary ion mass spectrometry imaging of Dictyostelium discoideum aggregation streams. [PDF]

open access: yesPLoS ONE, 2014
High resolution imaging mass spectrometry could become a valuable tool for cell and developmental biology, but both, high spatial and mass spectral resolution are needed to enable this.
John Daniel DeBord   +6 more
doaj   +8 more sources

Unlocking the potential of battery technologies through Time-of-Flight Secondary Ion Mass Spectrometry [PDF]

open access: yesScience and Technology of Advanced Materials
In response to the evolving demands in energy storage, the review underscores the critical need for ongoing research in battery technology, specifically centred to indispensable role of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) which aims
Prince Sharma   +3 more
doaj   +2 more sources

Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]

open access: yesMolecules
In this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
doaj   +2 more sources

Gold-Conjugated Nanobodies for Targeted Imaging Using High-Resolution Secondary Ion Mass Spectrometry [PDF]

open access: yesNanomaterials, 2021
Nanoscale imaging with the ability to identify cellular organelles and protein complexes has been a highly challenging subject in the secondary ion mass spectrometry (SIMS) of biological samples.
Paola Agüi-Gonzalez   +3 more
doaj   +2 more sources

Helium ion microscope – secondary ion mass spectrometry for geological materials [PDF]

open access: yesBeilstein Journal of Nanotechnology, 2020
The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities.
Matthew R. Ball   +5 more
doaj   +2 more sources

Sodium and potassium analysis of individual coccoliths by secondary ion mass spectrometry [PDF]

open access: yesScientific Reports
Coccoliths are individual plates of calcium carbonate that comprise the shells of marine calcifying haptophyte algae. Their remains provide an excellent sedimentary archive for the reconstruction of past environmental parameters.
Anne Roepert   +4 more
doaj   +2 more sources

Secondary‐Ion Mass Spectrometry of Genetically Encoded Targets [PDF]

open access: yesAngewandte Chemie - International Edition, 2015
AbstractSecondary ion mass spectrometry (SIMS) is generally used in imaging the isotopic composition of various materials. It is becoming increasingly popular in biology, especially for investigations of cellular metabolism. However, individual proteins are difficult to identify in SIMS, which limits the ability of this technology to study individual ...
Selda Kabatas   +2 more
exaly   +4 more sources

Time-of-Flight Secondary Ion Mass Spectrometry Coupled with Unsupervised Methods for Advanced Saffron Authenticity Screening [PDF]

open access: yesFoods
Saffron, renowned for its aroma and flavor, is susceptible to adulteration due to its high value and demand. Current detection methods, including ISO standards, often fail to identify specific adulterants such as safflower or turmeric up to 20% (w/w ...
Elisabetta De Angelis   +4 more
doaj   +2 more sources

An algorithm for U–Pb geochronology by secondary ion mass spectrometry [PDF]

open access: yesGeochronology, 2022
Secondary ion mass spectrometry (SIMS) is a widely used technique for in situ U–Pb geochronology of accessory minerals. Existing algorithms for SIMS data reduction and error propagation make a number of simplifying assumptions that degrade the precision
P. Vermeesch
doaj   +1 more source

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