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Unlocking the potential of battery technologies through Time-of-Flight Secondary Ion Mass Spectrometry [PDF]

Science and Technology of Advanced Materials
In response to the evolving demands in energy storage, the review underscores the critical need for ongoing research in battery technology, specifically centred to indispensable role of Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS) which aims
Prince Sharma, Gen Hasegawa, Sihao Xing, Naoaki Kuwata   +3 more
doaj   +2 more sources

Quantitative Study of Spodumene by Time-of-Flight Secondary Ion Mass Spectrometry (tof-SIMS) [PDF]

Molecules
In this paper, the quantitative feasibility of time-of-flight secondary ion mass spectrometry (tof-SIMS) for major and minor elements in spodumene was evaluated in terms of calibration method with a matrix-matched or non-matrix-matched standard and an ...
Xijuan Tan
doaj   +2 more sources

Sodium and potassium analysis of individual coccoliths by secondary ion mass spectrometry [PDF]

Scientific Reports
Coccoliths are individual plates of calcium carbonate that comprise the shells of marine calcifying haptophyte algae. Their remains provide an excellent sedimentary archive for the reconstruction of past environmental parameters.
Anne Roepert, Jack J. Middelburg, Gabriella M. Weiss, Marcel T. J. van der Meer, Lubos Polerecky   +4 more
doaj   +2 more sources

Helium ion microscope – secondary ion mass spectrometry for geological materials [PDF]

Beilstein Journal of Nanotechnology, 2020
The helium ion microscope (HIM) is a focussed ion beam instrument with unprecedented spatial resolution for secondary electron imaging but has traditionally lacked microanalytical capabilities.
Matthew R. Ball, Richard J. M. Taylor, Joshua F. Einsle, Fouzia Khanom, Christelle Guillermier, Richard J. Harrison   +5 more
doaj   +2 more sources

Automated Peak Annotation in Time-of-Flight Secondary Ion Mass Spectrometry via a Physics-Informed Probabilistic Framework [PDF]

Molecules
Peak annotation in Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) is a persistent bottleneck that typically requires the manual assignment of chemical formulas to hundreds of fragment ion peaks per spectrum.
Jiahua Chen, Yujie Cao, Xingyu Jiang, Chunpeng Wu, Qing Hao, Yun Hu, Jiahui Liu   +6 more
doaj   +2 more sources

Time-of-Flight Secondary Ion Mass Spectrometry Coupled with Unsupervised Methods for Advanced Saffron Authenticity Screening [PDF]

Foods
Saffron, renowned for its aroma and flavor, is susceptible to adulteration due to its high value and demand. Current detection methods, including ISO standards, often fail to identify specific adulterants such as safflower or turmeric up to 20% (w/w ...
Elisabetta De Angelis, Omar Al-Ayoubi, Rosa Pilolli, Linda Monaci, Alice Bejjani   +4 more
doaj   +2 more sources

An algorithm for U–Pb geochronology by secondary ion mass spectrometry [PDF]

Geochronology, 2022
Secondary ion mass spectrometry (SIMS) is a widely used technique for in situ U–Pb geochronology of accessory minerals. Existing algorithms for SIMS data reduction and error propagation make a number of simplifying assumptions that degrade the precision
P. Vermeesch
doaj   +1 more source

Identification of New Psychoactive Tryptamines 4-OH-MET and 4-AcO-DMT Using High Resolution Mass Spectrometry and Nuclear Magnetic Resonance Spectroscopy [PDF]

Fayixue Zazhi, 2021
Objective To detect the uncontrolled new psychoactive tryptamines involved in drug-related cases with high resolution mass spectrometry and nuclear magnetic resonance spectroscopy.
DING Ke-ran, NI Chun-fang, HE Si-yang, et al.
doaj   +1 more source

Triple Oxygen Isotope Measurements by Multi-Collector Secondary Ion Mass Spectrometry

Frontiers in Earth Science, 2021
Secondary ion mass spectrometry (SIMS) is a powerful technique for in situ triple oxygen isotope measurements that has been used for more than 30 years. Since pioneering works performed on small-radius ion microprobes in the mid-80s, tremendous progress ...
Nordine Bouden, Johan Villeneuve, Yves Marrocchi, Etienne Deloule, Evelyn Füri, Andrey Gurenko, Laurette Piani, Emilie Thomassot, Paula Peres, Firmino Fernandes   +9 more
doaj   +1 more source

Effectiveness of Wavelet Denoising on Secondary Ion Mass Spectrometry Signals

East European Journal of Physics, 2023
Wavelet theory has already achieved huge success. For Secondary Ions Mass Spectrometry (SIMS) signals, denoising the secondary signal, which is altered by the measurement, is considered that an essential step prior to applying such a signal processing ...
Nadia Dahraoui, M'hamed Boulakroune, S. Khelfaoui, S. Kherroubi, Yamina Benkrima   +4 more
doaj   +1 more source