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Liquid secondary ion mass spectrometry
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987 James K. Olthoff, Robert J. Cotter
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Secondary Ion Mass Spectrometry
Vacuum, 1994When a solid target is bombarded by ions having energies of several keV, different complex processes may occur simultaneously. When the ion energy is low (typically less than 2 keV), the target surface can scatter the incident ions by an elastic collision mechanism. Analysis of the energetics of this collision is called ion scattering spectroscopy ISS,
Grimblot, J., Abon, M.
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Secondary Ion Mass Spectrometry
2014In Secondary Ion Mass Spectrometry (SIMS) a focused beam of energetic ions (so-called primary ions) is targeted onto the surface of a solid sample. Primary ions dissipate their energy, leading to the sputtering and ionisation of the outmost atoms of the sample surface. The resulting secondary ions are accelerated and transferred to a magnetic analyser.
Sangély, L. +11 more
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Cluster secondary ion mass spectrometry microscope mode mass spectrometry imaging
Rapid Communications in Mass Spectrometry, 2013RATIONALE Microscope mode imaging for secondary ion mass spectrometry is a technique with the promise of simultaneous high spatial resolution and high‐speed imaging of biomolecules from complex surfaces. Technological developments such as new position‐sensitive detectors, in combination with polyatomic primary ...
Kiss, A. +3 more
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Secondary Ion Mass Spectrometry
Annual Review of Materials Science, 1983Secondary ion mass spectrometry (SIMS) is a technique for surface and thin-film analysis with a long history and a mature instrumental base dating from the early 1960s, which nevertheless has only recently achieved broad credibility as an analytical technique. This lack of acceptance stems from the complexity ofthe sputtering and ion emission processes,
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Secondary ion mass spectrometry
Vacuum, 1984Abstract The CAMECA IMS 300 instrument uses a primary beam of oxygen, argon or nitrogen ions to give secondary ion emission from the sample surface. The resulting ionic species are identified by mass spectrometry and selectively transmitted to form images of their distribution in the surface of the specimen, or to provide measures of the elemental ...
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Aspects of quantitative secondary ion mass spectrometry
Nuclear Instruments and Methods, 1980Abstract The present state of quantitative secondary ion mass spectrometry (SIMS) is analysed critically. Because of the strong gain in sensitivity obtained by loading the instantaneous sample surface with either oxygen or cesium, chemically enhanced secondary ion emission is discussed almost exclusively.
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Instrumental aspects of secondary ion mass spectrometry and secondary ion imaging mass spectrometry
Vacuum, 1972Abstract A short survey of the varieties of the Secondary Ion Mass Spectrometry (SIMS) known at present is given. The principle of quantitative analysis with respect to thin film analysis is discussed. The properties of SIMS and SIIMS (Secondary Ion Imaging Mass Spectrometry) are compared with those of Electron Microprobe Analysis.
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