Results 251 to 260 of about 339,173 (287)

Secondary ion mass spectrometry

Vacuum, 1984
Abstract The CAMECA IMS 300 instrument uses a primary beam of oxygen, argon or nitrogen ions to give secondary ion emission from the sample surface. The resulting ionic species are identified by mass spectrometry and selectively transmitted to form images of their distribution in the surface of the specimen, or to provide measures of the elemental ...
openaire   +1 more source

Studies of adhesion by secondary ion mass spectrometry

IBM Journal of Research and Development, 1994
The study of adhesion requires the characterization of surfaces and interfaces. One surface analytical technique which has been used extensively in the study of adhesion is secondary ion mass spectrometry (SIMS). This paper provides a brief introduction to the basis of this technique and describes the two broad categories of SIMS analyses: static and ...
openaire   +1 more source

Secondary Ion Mass Spectrometry

Analytical Chemistry, 2008
  +6 more sources

Secondary ion mass spectrometry of organic compounds

TrAC Trends in Analytical Chemistry, 1982
Parent-like secondary ions of the general composition (M+H)+ and (M-H)−, where M stands for an organic molecule, are emitted with very high absolute yields from corresponding molecular layers on solid surfaces during ion bombardment. That was the surprising result of two systematic SIMS investigations of amino acids (1), and further groups of organic ...
openaire   +1 more source

Beam optics in secondary ion mass spectrometry

Nuclear Instruments and Methods in Physics Research, 1981
Abstract Secondary ion mass spectrometry (SIMS), a technique for characterizing solids and surfaces, is distinguished by high sensitivity and its applicability to detect all elements. It can be used for surface research, in-depth concentration profiling, isotopic work, and the identification of compounds.
openaire   +2 more sources

Molecular secondary ion mass spectrometry

Analytical Chemistry, 1980
R J, Day, S E, Unger, R G, Cooks
openaire   +2 more sources

Secondary ion mass spectrometry in art and archaeology

Thermochimica Acta, 2000
Abstract The continuous demand for new analytical methods for use in studies of relevance to art and archaeology has prompted researchers to investigate the possible applications of a variety of non-conventional and innovative analytical techniques. Secondary ion mass spectrometry was first used in this field in the 1980s and a number of applications
openaire   +2 more sources

Cellular imaging with secondary ion mass spectrometry

The Analyst, 2009
This article is a concise review of the application of secondary ion mass spectrometry (SIMS) to the imaging of biological cells. The paper covers the various advantages and disadvantages of different approaches to SIMS analysis with respect to the information that can be gained from the interrogation of the cells.
openaire   +2 more sources

SIMS — Secondary Ion Mass Spectrometry

1992
Secondary ion mass spectroscopy (SIMS) is an ion beam analysis technique useful for characterising the top few micrometres of samples. Primary ions of energy 0.5–20 keV, commonly O 2 + , Cs+, Ar+ but also ions such as Ga+, Xe+, O-, C m m + and SF 6 + are used to erode the sample surface and the secondary elemental or cluster ions formed from the target
R. J. MacDonald, B. V. King
openaire   +1 more source

Secondary Ion Mass Spectrometry, SIMS

1999
Secondary ion mass spectrometry (SIMS) is based on the ejection of charged atomic and molecular species from the surface of a solid sample when it is bombarded by a stream of heavy particles. J. J. Thomson1 first observed this phenomenon in 1910. Later Arnot and Milligan2 investigated the secondary ion emission resulting from positive ion bombardment ...
openaire   +1 more source