Results 221 to 230 of about 2,387,160 (293)
Mechanistic Insights into the Formation of Monodisperse Porous Poly(GMA-<i>co</i>-EDMA) Microspheres. [PDF]
Wagner A +7 more
europepmc +1 more source
Low‐voltage FIB‐SEM tomography combined with a image preprocessing pipeline improves phase contrast and enables reliable machine‐learning segmentation of conductive networks in lithium‐ion battery electrodes. Structural descriptors are extracted from segmented images, done semimanually and automated, and compared.
Lisa Beran +6 more
wiley +1 more source
Morphological and molecular characterization of Nepalese Common Bean (Phaseolus vulgaris L.) Landraces. [PDF]
Thapa P +4 more
europepmc +1 more source
This study applies machine learning regression to predict chromium layer thickness in decorative trivalent chromium electroplating, using 441 experiments from laboratory‐scale (1L) and pilot‐scale (14L) setups. Tree‐based models, particularly CatBoost, outperformed linear regression by capturing nonlinear parameter interactions (R2$R^2$ up to 0.77 ...
Christoph Baumer +4 more
wiley +1 more source
Seed Morphotype and Population Origin Shape Germination Responses of Three <i>Salicornia perennans</i> Willd. subsp. <i>perennans</i> Populations Under Different NaCl Concentrations. [PDF]
Ventura I, Lombardi T.
europepmc +1 more source
Experiments and thermophysical simulations were conducted to investigate the electron beam powder bed fusion electron beam (PBF‐EB/M) process for the γ′‐strengthened nickel‐based superalloy Inconel 738LC. The results demonstrate the impact of process‐induced microstructural variations on high‐temperature mechanical behavior, providing a basis for ...
Jan Niklas Petenati +11 more
wiley +1 more source
Multivariate analysis of Solanum incanum L. based on morphological characterizations. [PDF]
Khadivi A +5 more
europepmc +1 more source
The OntOMat ontology establishes a structured framework for polymer matrix fiber reinforced composite materials, integrating manufacturing processes, characterization methods, and multiscale design through the VDI/VDE 3682 formalized process description standard.
Nicolas Christ +19 more
wiley +1 more source
Multiplet lines in seeded stimulated Mn <i>Kα</i> <sub>1</sub> x-ray emission. [PDF]
Kroll T +22 more
europepmc +1 more source
Deep‐UV (258 nm) femtosecond pulses enable uniform amorphous silicon writing on Si(100)/(111) with a six‐fold larger fluence amorphization window than NIR methods. Optimized fluence and overlap yield 20–45 nm uniform and continuous amorphous layers. Microscopy shows sharp interfaces, and real‐time reflectivity reveals nanosecond melt–resolidification ...
Wissal Benali +5 more
wiley +1 more source

