Results 261 to 270 of about 3,965,014 (302)

Sem-Based Characterization Techniques

MRS Proceedings, 1986
AbstractThe scanning electron microscope is now a common instrument in materials characterization laboratories. The basic role of the SEM as a topographic imaging system has steadily been expanding to include a wide variety of SEM-based analytical techniques.
Phillip E. Russell
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SEM characterization of cokes and carbons

Fuel, 1983
Abstract Methods are described for the characterization of cokes and carbons in terms of their basic structural units — building blocks — as revealed by scanning electron microscopy of fractured and etched surfaces. Four basic forms of structural component are identified.
Douglas Hays, John W. Patrick, Alan Walker   +2 more
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SEM techniques for materials characterization

SPIE Proceedings, 1997
The scanning electron microscope (SEM) can be used to study and characterize a wide variety of materials used in photonic applications. These range from highly conductive samples to insulating materials. Several different techniques make use of this versatile tool. These include secondary electron imaging, backscattered electron imaging, X-ray analysis
Jacques Beauvais, Dominique Drouin, Raynald Gauvin   +2 more
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SEM characterization of multilayer structures

Vacuum, 1991
Multilayer stuctures are now widely used in numerous fields of technology, therefore the development of techniques for non-destuctive characterization of these stuctures is of great importance. The thickness of layers in multilayer stuctures can range from 1 nm to some μm, thus in order to measure their parameters it is necessary to develop different ...
NN Dremova, EB Yakimov
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Zinc eugenolate crystals: SEM detection and characterization

Dental Materials, 1986
Abstract Zinc oxide eugenol-based dental cements are not employed routinely as permanent luting materials because the reaction-product matrix is not a stable, high-strength phase. Difficulty in identifying zinc eugenolate product has prevented determination of the structure-property relationships for the matrix.
S C, Bayne, E H, Greener, E P, Lautenschlager, S J, Marshall, G W, Marshall   +4 more
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Characterization of nanoline based on SEM images

SPIE Proceedings, 2013
In this paper, nanolines are fabricated on photoresist using electron beam lithography (EBL) technique. The trapeziform of the cross-section is studied through analysis of the top-down scan electron microscope (SEM) image of the nanolines. Width is not adequate to describe the nanolines.
Chen-ying Wang, Shu-ming Yang, Qi-jing Lin, Zhuang-de Jiang   +3 more
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Characterization of silicon ribbon by the SEM methods

physica status solidi c, 2011
AbstractInvestigation of silicon layers grown on carbon foil was carried out using the Electron Backscatter Diffraction (EBSD) and Electron Beam Induced Current (EBIC) methods. The EBSD investigations showed that the surface of silicon ribbon is close to (110) and that most of grain boundaries (GBs) are twin boundaries with the misorientation angle of ...
Sergey Brantov, Olga Feklisova, Eugene Yakimov   +2 more
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Characterization of ceramic fibers in the SEM and TEM

Proceedings, annual meeting, Electron Microscopy Society of America, 1986
Ceramic fiber composites are currently being developed for potential high temperature structural applications. Fibers for these applications are being produced from polymer precursors, such as Nicalon™ silicon carbide (SiC) fibers, commercially produced from polycarbosilane (Nippon Carbon Co.).
L.C. Sawyer, R.T. Chen
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Three-dimensional characterization of microstructures in a SEM

Measurement Science and Technology, 2005
A method for three-dimensional reconstruction and imaging of surface topography in a scanning electron microscope (SEM) is briefly presented. The method is based on the 'shape from shadows' approach and is particularly suitable for relatively smooth surfaces, where stereoscopic methods may be less efficient.
Wlodzimierz Drzazga, Jaroslaw Paluszynski, Witold Slowko   +2 more
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Fly ash characterization by SEM–EDS

Fuel, 2006
A study conducted at the National Energy Technology Laboratory characterized twelve Class F fly ash samples from nine PC power plants in PA, WV, MD and TN, using scanning electron microscopy (SEM) and energy dispersive spectroscopy (EDS). Both the surface and internal structure of fly ash particles were analyzed.
B KUTCHKO, A KIM
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