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SEM techniques for materials characterization

SPIE Proceedings, 1997
The scanning electron microscope (SEM) can be used to study and characterize a wide variety of materials used in photonic applications. These range from highly conductive samples to insulating materials. Several different techniques make use of this versatile tool. These include secondary electron imaging, backscattered electron imaging, X-ray analysis
Jacques Beauvais   +2 more
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SEM characterization of multilayer structures

Vacuum, 1991
Multilayer stuctures are now widely used in numerous fields of technology, therefore the development of techniques for non-destuctive characterization of these stuctures is of great importance. The thickness of layers in multilayer stuctures can range from 1 nm to some μm, thus in order to measure their parameters it is necessary to develop different ...
NN Dremova, EB Yakimov
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Zinc eugenolate crystals: SEM detection and characterization

Dental Materials, 1986
Abstract Zinc oxide eugenol-based dental cements are not employed routinely as permanent luting materials because the reaction-product matrix is not a stable, high-strength phase. Difficulty in identifying zinc eugenolate product has prevented determination of the structure-property relationships for the matrix.
S C, Bayne   +4 more
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Sem-Based Characterization Techniques

MRS Proceedings, 1986
AbstractThe scanning electron microscope is now a common instrument in materials characterization laboratories. The basic role of the SEM as a topographic imaging system has steadily been expanding to include a wide variety of SEM-based analytical techniques.
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SEM characterization of cokes and carbons

Fuel, 1983
Abstract Methods are described for the characterization of cokes and carbons in terms of their basic structural units — building blocks — as revealed by scanning electron microscopy of fractured and etched surfaces. Four basic forms of structural component are identified.
Douglas Hays   +2 more
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