Results 141 to 150 of about 66,890 (252)

Ammonothermal Crystal Growth of Functional Nitrides for Semiconductor Devices: Status and Potential. [PDF]

Materials (Basel)
Wostatek T, Chirala VYMR, Stoddard N, Civas EN, Pimputkar S, Schimmel S.   +5 more
europepmc   +1 more source

Erratum: Implementation of PPI with Nano Amorphous Oxide Semiconductor Devices for Medical Applications [Corrigendum]. [PDF]

Int J Nanomedicine, 2020
europepmc   +1 more source

On the Stability of Permanent Electrochemical Doping of Quantum Dot, Fullerene, and Conductive Polymer Films in Frozen Electrolytes for Use in Semiconductor Devices. [PDF]

ACS Appl Nano Mater, 2019
Gudjonsdottir S, van der Stam W, Koopman C, Kwakkenbos B, Evers WH, Houtepen AJ.   +5 more
europepmc   +1 more source

Strain Engineering of Magnetoresistance and Magnetic Anisotropy in CrSBr

Advanced Materials, EarlyView.
Biaxial compressive strain significantly enhances magnetoresistance and critical saturation fields in thin flakes of the 2D magnet CrSBr, along all three crystallographic axes. First‐principles calculations link these effects to strain‐induced increases in exchange interactions and magnetic anisotropy.
Eudomar Henríquez‐Guerra, Alberto M. Ruiz, Marta Galbiati, Álvaro Cortés‐Flores, Daniel Brown, Esteban Zamora‐Amo, Lisa Almonte, Andrei Shumilin, Juan Salvador‐Sánchez, Ana Pérez‐Rodríguez, Iñaki Orue, Andrés Cantarero, Andres Castellanos‐Gomez, Federico Mompeán, Mar Garcia‐Hernandez, Efrén Navarro‐Moratalla, Enrique Diez, Mario Amado, José J. Baldoví, M. Reyes Calvo   +19 more
wiley   +1 more source

Reliable low-temperature die attach process using Ag/Sn/Ag sandwich structure for high-temperature semiconductor devices. [PDF]

Sci Rep, 2019
Choi J, Choi GS, An SJ.
europepmc   +1 more source

Artificial Intelligence‐Assisted Workflow for Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling

Advanced Materials, EarlyView.
AI‐Assisted Workflow for (Scanning) Transmission Electron Microscopy: From Data Analysis Automation to Materials Knowledge Unveiling. Abstract (Scanning) transmission electron microscopy ((S)TEM) has significantly advanced materials science but faces challenges in correlating precise atomic structure information with the functional properties of ...
Marc Botifoll, Ivan Pinto‐Huguet, Enzo Rotunno, Thomas Galvani, Catalina Coll, Payam Habibzadeh Kavkani, Maria Chiara Spadaro, Yann‐Michel Niquet, Martin Børstad Eriksen, Sara Martí‐Sánchez, Georgios Katsaros, Giordano Scappucci, Peter Krogstrup, Giovanni Isella, Andreu Cabot, Gonzalo Merino, Pablo Ordejón, Stephan Roche, Vincenzo Grillo, Jordi Arbiol   +19 more
wiley   +1 more source

Excitons and the lifetime of organic semiconductor devices. [PDF]

Philos Trans A Math Phys Eng Sci, 2015
Forrest SR.
europepmc   +1 more source

Kelvin Probe Force Microscopy in Bionanotechnology: Current Advances and Future Perspectives

Advanced Materials, EarlyView.
Kelvin probe force microscopy (KPFM) enables the nanoscale mapping of electrostatic surface potentials. While widely applied in materials science, its use in biological systems remains emerging. This review presents recent advances in KPFM applied to biological samples and provides a critical perspective on current limitations and future directions for
Ehsan Rahimi, Mario Palacios‐Corella, Arjan Mol, Salvador Pané, Josep Puigmartí‐Luis   +4 more
wiley   +1 more source

A design TCADAS tool for semiconductor devices and case study of 65 nm conventional floating-gate MOS transistor. [PDF]

Heliyon
Dang Cong T, Hoang T.
europepmc   +1 more source

Implementation of PPI with Nano Amorphous Oxide Semiconductor Devices for Medical Applications.

Int J Nanomedicine, 2020
Dai M, Wu Z, Qi S, Huo C, Zhang Q, Zhang X, Webster TJ, Zhang H.   +7 more
europepmc   +1 more source