Results 301 to 310 of about 29,331,473 (379)

Mass Spectrometry Imaging. [PDF]

open access: yesAnal Chem
Körber A, Anthony IGM, Heeren RMA.
europepmc   +1 more source

SIMS method of material wear diagnosis

2009 IEEE International Conference on Industrial Technology, 2009
The presented method is based on use of SIMS analysis. SIMS analysis allowed experimental demonstration of 100 … 300 times increase in the dissolved hydrogen concentration at a depth of 1 … 20 mm in the pipe wall after 20 years of operation. The hydrogen dissolved in the pipe wall from a gas flow in a gas-main pipeline.
Alfred Benninghoven, Evgenii A. Deulin
openaire   +2 more sources

Investigation of hydrogen sensitivity of SIMS method

Surface and Interface Analysis, 1992
Abstract Generally, papers in which hydrogen detection by the SIMS method is described do not touch upon the sensitivity and background level of hydrogen during the SIMS analysis. Problems connected with the detection and sensitivity of hydrogen in our SIMS equipment are discussed in this paper.
F. Pavlyak
openaire   +2 more sources

Lunar Surface Observation usinge Remote SIMS Method

54th International Astronautical Congress of the International Astronautical Federation, the International Academy of Astronautics, and the International Institute of Space Law, 2003
This paper presents the results of a conceptual study for lunar surface observation using Remote SIMS (Secondary Ion Mass Spectrometry) installed on the lunar Lander and the results of the preliminary experiments of the secondary ion generation from the water ice that simulates the permanently shaded region of Lunar surface by fast ion bombardment ...
Koji Tanaka, S. Sasaki
openaire   +2 more sources

Molecular imaging of cannabis leaf tissue with MeV-SIMS method

Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2016
To broaden our analytical capabilities with molecular imaging in addition to the existing elemental imaging with micro-PIXE, a linear Time-Of-Flight mass spectrometer for MeV Secondary Ion Mass Spectrometry (MeV-SIMS) was constructed and added to the existing nuclear microprobe at the Jožef Stefan Institute.
Jencic, Bostjan   +12 more
openaire   +5 more sources

In situ U–Pb SIMS (IN-SIMS) micro-baddeleyite dating of mafic rocks: Method with examples

Precambrian Research, 2010
Abstract An in situ U–Pb SIMS (IN-SIMS) method to date micro-baddeleyite crystals as small as 3 μm is presented with results from three samples that span a variety of ages and geologic settings. The method complements ID-TIMS geochronology by extending the range of dateable crystals to sizes smaller than can be recovered by physical separation. X-ray
Kevin R. Chamberlain   +8 more
openaire   +2 more sources

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