Software reliability growth models (SRGMs) often assume a linear relationship between the fault detection rate (FDR) and testing effort function (TEF), which fails to capture their dynamic and nonlinear characteristics.
Yixin Qiao +4 more
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Imperfect Debugging SRGM with FDP–FCP
Over the past few decades, extensive research has been conducted on software reliability growth models based on the non-homogeneous Poisson process. However, most existing studies rely on the premise of perfect debugging, failing to fully consider key ...
Xiangyi Qiu, Yinglei Song
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Software reliability analysis is vital for evaluating software quality, where reliability is the probability of failure operation of a system for a specified duration. Numerous SRGMs have been proposed, mainly based on the NHPP to enhance the reliability
Kaushal Kumar +3 more
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Multi-release software model based on testing coverage incorporating random effect (SDE). [PDF]
Bibyan R, Anand S, Aggarwal AG, Kaur G.
europepmc +1 more source
Comprehensive evaluation of software system reliability based on component-based generalized G-O models. [PDF]
Wang Y, Liu H, Yuan H, Zhang Z.
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FLEXIBLE SOFTWARE RELIABILITY GROWTH MODELS
<p>ENGLISH ABSTRACT: Numerous Software Reliability Growth Models (SRGMs) have been discussed in the literature. These models are used to predict fault content and reliability of software.
P.K. Kapur +3 more
doaj
Optimization based machine learning algorithms for software reliability growth models
Software reliability is a critical factor for system performance and safety, especially in defense industries, where operational failures can have severe consequences.
Myeongguen Shin +4 more
doaj
A novel approach of NPSO on dynamic weighted NHPP model for software reliability analysis with additional fault introduction parameter. [PDF]
Rani P, Mahapatra GS.
europepmc +1 more source
Quantitative Quality Evaluation of Software Products by Considering Summary and Comments Entropy of a Reported Bug. [PDF]
Kumari M +6 more
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A testing-coverage software reliability model considering fault removal efficiency and error generation. [PDF]
Li Q, Pham H.
europepmc +1 more source

