Results 121 to 130 of about 1,813,028 (298)

A Knowledge‐Based Approach for Understanding and Managing Additive Manufacturing Data

open access: yesAdvanced Engineering Materials, EarlyView.
Additive manufacturing processes generate a large amount of data. Effectively managing, understanding, and retrieving information from this data remains a major challenge. Therefore, we propose an ontology‐based approach to integrate heterogeneous data, enable semantic queries, and support decision‐making.
Mina Abd Nikooie Pour   +5 more
wiley   +1 more source

Is an Apple an Orange? A Large Language Model Benchmark for Candidate Term Extraction and Subclass Decisions Against Upper Ontologies in Engineering and Materials Science

open access: yesAdvanced Engineering Materials, EarlyView.
Building machine‐readable vocabularies for materials science is slow, expert‐driven work. This study benchmarks 13 large language models on two of its first steps: finding candidate terms in engineering articles and deciding where they belong in a class hierarchy.
Thomas Bjarsch   +3 more
wiley   +1 more source

Ontology‐Aligned Structuring and Reuse of Multimodal Materials Data and Workflows Toward Automatic Reproduction

open access: yesAdvanced Engineering Materials, EarlyView.
Reproduction of stacking fault energy calculations from literature with a semi‐automated large language model‐assisted extraction procedure: extraction of simulation protocol, atomistic structures, computational parameters, and reported results, ontology alignment, knowledge graph construction and, finally, recomputation forvalidation.
Sepideh Baghaee Ravari   +5 more
wiley   +1 more source

Joint Image Deblurring and Matching with Blurred Invariant-Based Sparse Representation Prior

open access: yesComplexity, 2019
Image matching is important for vision-based navigation. However, most image matching approaches do not consider the degradation of the real world, such as image blur; thus, the performance of image matching often decreases greatly. Recent methods try to
Yuanjie Shao   +3 more
doaj   +1 more source

Data separation by sparse representations [PDF]

open access: yes, 2012
Recently, sparsity has become a key concept in various areas of applied mathematics, computer science, and electrical engineering. One application of this novel methodology is the separation of data, which is composed of two (or more) morphologically distinct constituents. The key idea is to carefully select representation systems each providing sparse
openaire   +3 more sources

Microstructure Reconstruction in Battery Electrodes Using Machine Learning Based on Low‐Voltage Focused Ion Beam–Scanning Electron Microscopy Tomography Images

open access: yesAdvanced Engineering Materials, EarlyView.
Low‐voltage FIB‐SEM tomography combined with a image preprocessing pipeline improves phase contrast and enables reliable machine‐learning segmentation of conductive networks in lithium‐ion battery electrodes. Structural descriptors are extracted from segmented images, done semimanually and automated, and compared.
Lisa Beran   +6 more
wiley   +1 more source

Machine Learning‐Supported Analysis for Predicting and Visualizing Nonlinear Relationships Between Material Properties in Electroplated Chromium Layers

open access: yesAdvanced Engineering Materials, EarlyView.
This study applies machine learning regression to predict chromium layer thickness in decorative trivalent chromium electroplating, using 441 experiments from laboratory‐scale (1L) and pilot‐scale (14L) setups. Tree‐based models, particularly CatBoost, outperformed linear regression by capturing nonlinear parameter interactions (R2$R^2$ up to 0.77 ...
Christoph Baumer   +4 more
wiley   +1 more source

A Practical Noise2Noise Denoising Pipeline for High‐Throughput Raman Spectroscopy

open access: yesAdvanced Engineering Materials, EarlyView.
A lightweight and reproducible denoising pipeline for high‐throughput Raman spectroscopy is introduced, based on a 1D convolutional autoencoder trained with a Noise2Noise strategy. Using only repeated short‐exposure acquisitions, the method suppresses stochastic noise without reference spectra, enabling reliable spectral reconstruction while preserving
David Martin‐Calle   +5 more
wiley   +1 more source

Fourier ptychographic microscopy with sparse representation

open access: yesScientific Reports, 2017
Fourier ptychographic microscopy (FPM) is a novel computational microscopy technique that provides intensity images with both wide field-of-view and high-resolution. By combining ideas from synthetic aperture and phase retrieval, FPM iteratively stitches
Yongbing Zhang   +3 more
doaj   +1 more source

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