Results 111 to 120 of about 20,096 (267)
Optical strain measuring techniques for high temperature tensile testing [PDF]
A number of optical techniques used for the analysis of in-plane displacements or strains are reviewed. The application would be for the high temperature, approximately 1430 C (2600 F), tensile testing of ceramic composites in an oxidizing atmosphere ...
Gyekenyesi, John Z., Hemann, John H.
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Determination of fracture mechanics parameters on a base of local displacement measurements
Fracture and Structural Integrity, 2013 New experimental technique for a determination of the stress intensity factor (SIF) and T-stress values is developed and verified. The approach assumes combining the crack compliance method and optical interferometric measurements of local deformation ...
Yu. G. Matvienko +2 more
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SPECKLE INTERFEROMETRY AT THE U.S. NAVAL OBSERVATORY. XVII. [PDF]
, 2011 Brian D. Mason +2 more
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Localization phenomenon investigation on Smated stainless samples by speckle interferometry
EPJ Web of Conferences, 2010 In-plane Electronic Speckle Pattern Interferometry (ESPI) has been successfull y used during tensile tests on SMA-treated (Surface Mechanical Attrition Treatment) and as received 316L stainless steel in order to measure the strain rate field.
François M., Montay G., Petit J.
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Full-field displacement measurement of corneoscleral shells by combining multi-camera speckle interferometry with 3D shape reconstruction. [PDF]
J Mech Behav Biomed Mater, 2020 Bianco G, Bruno L, Girkin CA, Fazio MA.
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Surface Displacement Measurements of Artworks: New Data Processing for Speckle Pattern Interferometry [PDF]
, 2022 Jessica Auber--Le Saux +5 more
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Experimental Study of Copper Alloys by Electronic Speckle Pattern Interferometry [PDF]
, 2019 Dana Bakošová
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PISCO2: the new speckle camera of the Nice 76-cm refractor
, 2014 We present the new speckle camera PISCO2 made in 2010-2012, for the 76-cm refractor of C\^ote d'Azur Observatory. It is a focal instrument dedicated to the observation of visual binary stars using high angular resolution speckle interferometry techniques
Bonneau, Daniel +5 more
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