Results 131 to 140 of about 168,541 (274)
Investigation of Wavelength Scanning Interferometry for Embedded Metrology
The tremendous growth in the manufacture of a wide range of deterministic and complex free form surfaces, has made surface metrology an essential part of the manufacturing process.
Muhamedsalih, Hussam
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Self-Mixing Diode Laser Interferometry
, 2010 Self-mixing interferometry in a laser diode is a very powerful tool in measurement science. The Self-mixing interferometer is a very robust and low cost interferometer with extreme simplicity in alignment and setup.
Shrestha, Pawan Kumar
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Infrared Speckle Interferometry with 2-D Arrays
, 1994 We describe results from a program of speckle interferometry with two-dimensional infrared array detectors. Analysis of observations of eta Carinae made with 58 x 62 InSb detector are discussed.
Monin, J. L. +2 more
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Frequency-division-multiplexing technique for imaging metrology [PDF]
, 2014 An algorithm to multiplex multiple image captures simultaneously onto a single image sensor at full frame resolution was developed for imaging metrology. Parseval’s theorem was used to obtain the image intensity from image time-series of around typically
Bledowski, Ian A.
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, 1976 The techniques of speckle beam holographic interferometry and speckle photographic interferometry are described. In particular, their practical limitations and their applications to the existing holographic nondestructive test system are ...
Liu, H. K.
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A novel swarm-based algorithm for phase unwrapping [PDF]
, 2014 Dissertação (mestrado) - Universidade Federal de Santa Catarina, Centro Tecnológico, Programa de Pós-Graduação em Engenharia Mecânica, Florianópolis, 2014.O correto funcionamento de tubulações subterrâneas para o transporte de gás e petróleo depende de ...
Maciel, Lucas da Silva
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Fracture and Structural Integrity, 2014 Residual stresses occur in many manufactured structures and components. Great number of investigations have been carried out to study this phenomenon.
C. Barile +3 more
doaj
Phase shifting speckle interferometry,"
, 1985 Speckle patterns have high frequency phase data, which make it difficult to find the absolute phase of a single speckle pattern; however, the phase of the difference between two correlated speckle patterns can be determined.
Katherine Creath
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