Frequency-comb-referenced multiwavelength interferometry for high-precision and high-speed 3D measurement in heterogeneous semiconductor packaging. [PDF]
Park JH +9 more
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The Diagnosis and Treatment Technology of Port-Wine Stain, and the Prospect of Future Treatment. [PDF]
Li M, Song Y, Zhou J.
europepmc +1 more source
OCTA in retina practice - Has it come of age? [PDF]
Bhende M.
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Automating sentinel-1 SLC product processing: Parallelization and optimization for efficient polarimetric parameter extraction. [PDF]
Fernando H +5 more
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Quantum-inspired computational wavefront shaping enables turbulence-resilient distributed aperture synthesis imaging. [PDF]
Sun S +6 more
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Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source. [PDF]
Shi X +11 more
europepmc +1 more source
Phase-shifting speckle interferometry
Applied Optics, 1985Speckle patterns have high frequency phase data, which make it difficult to find the absolute phase of a single speckle pattern; however, the phase of the difference between two correlated speckle patterns can be determined. This is done by applying phase-shifting techniques to speckle interferometry, which will quantitatively determine the phase of ...
Katherine Creath
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Fringe scanning speckle-pattern interferometry
Applied Optics, 1985Digital speckle-pattern interferometry systems for automatic measurement of deformations of a diffuse object are presented, which are based on a fringe scanning method with phase-shifted speckle interferograms. A digital speckle pattern before deformation of an object is recorded in the mass storage device of a computer facility.
S, Nakadate, H, Saito
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Subfeature speckle interferometry
Optics Letters, 1995A novel speckle technique, subfeature speckle interferometry, is introduced that relies on the amplitude interference of two independent speckle patterns, originating from coherent illumination, by use of an optical system that produces interferometric quality interference fringes on a scale comparable with the speckle correlation length.
D, Burckel +4 more
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