Results 251 to 260 of about 7,210,108 (295)

Secondary Ion Mass Spectrometry

Vacuum, 1994
When a solid target is bombarded by ions having energies of several keV, different complex processes may occur simultaneously. When the ion energy is low (typically less than 2 keV), the target surface can scatter the incident ions by an elastic collision mechanism. Analysis of the energetics of this collision is called ion scattering spectroscopy ISS,
Grimblot, J., Abon, M.
  +5 more sources

Secondary-Ion Mass Spectrometry of Genetically Encoded Targets [PDF]

Angewandte Chemie - International Edition, 2015
AbstractSecondary ion mass spectrometry (SIMS) is generally used in imaging the isotopic composition of various materials. It is becoming increasingly popular in biology, especially for investigations of cellular metabolism. However, individual proteins are difficult to identify in SIMS, which limits the ability of this technology to study individual ...
Silvio O. Rizzoli, Ulf Diederichsen, Felipe Opazo   +2 more
exaly   +4 more sources

Instrumental aspects of secondary ion mass spectrometry and secondary ion imaging mass spectrometry

Vacuum, 1972
Abstract A short survey of the varieties of the Secondary Ion Mass Spectrometry (SIMS) known at present is given. The principle of quantitative analysis with respect to thin film analysis is discussed. The properties of SIMS and SIIMS (Secondary Ion Imaging Mass Spectrometry) are compared with those of Electron Microprobe Analysis.
openaire   +1 more source

Aspects of quantitative secondary ion mass spectrometry

Nuclear Instruments and Methods, 1980
Abstract The present state of quantitative secondary ion mass spectrometry (SIMS) is analysed critically. Because of the strong gain in sensitivity obtained by loading the instantaneous sample surface with either oxygen or cesium, chemically enhanced secondary ion emission is discussed almost exclusively.
openaire   +2 more sources

Secondary Ion Mass Spectrometry

Annual Review of Materials Science, 1983
Secondary ion mass spectrometry (SIMS) is a technique for surface and thin-film analysis with a long history and a mature instrumental base dating from the early 1960s, which nevertheless has only recently achieved broad credibility as an analytical technique. This lack of acceptance stems from the complexity ofthe sputtering and ion emission processes,
openaire   +1 more source

Localization of ions in retina by secondary ion mass spectrometry

Experimental Eye Research, 1976
Abstract Ionic distribution and localization in tissues is an important aspect of normal retinal physiology and of the pathogenesis of retinal disease. Secondary ion mass spectrometry (SIMS) has been utilized to simultaneously identify and localize ions in retinal tissue.
M B, Bellhorn, R K, Lewis
openaire   +2 more sources

Imaging lipids with secondary ion mass spectrometry

Biochimica et Biophysica Acta (BBA) - Molecular and Cell Biology of Lipids, 2014
This review discusses the application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and magnetic sector SIMS with high lateral resolution performed on a Cameca NanoSIMS 50(L) to imaging lipids. The similarities between the two SIMS approaches and the differences that impart them with complementary strengths are described, and various ...
Mary L, Kraft, Haley A, Klitzing
openaire   +2 more sources

Ion neutralisation in secondary ion mass spectrometry

Nuclear Instruments and Methods in Physics Research, 1983
Abstract Experiments are described which allow the characteristic velocity of ion neutralisation, A / a , to be measured independent of the secondary ion energy by varying the angle of ion emission and hence the velocity component perpendicular to the surface.
R.F. Garrett, R.J. Macdonald, D.J. O'connor   +2 more
openaire   +1 more source

Secondary ion mass spectrometry

Vacuum, 1984
Abstract The CAMECA IMS 300 instrument uses a primary beam of oxygen, argon or nitrogen ions to give secondary ion emission from the sample surface. The resulting ionic species are identified by mass spectrometry and selectively transmitted to form images of their distribution in the surface of the specimen, or to provide measures of the elemental ...
openaire   +1 more source

Secondary Ion Mass Spectrometry

Analytical Chemistry, 2008
  +6 more sources