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Secondary Ion Mass Spectrometry
2014In Secondary Ion Mass Spectrometry (SIMS) a focused beam of energetic ions (so-called primary ions) is targeted onto the surface of a solid sample. Primary ions dissipate their energy, leading to the sputtering and ionisation of the outmost atoms of the sample surface. The resulting secondary ions are accelerated and transferred to a magnetic analyser.
Sangély, L. +11 more
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Instrumental aspects of secondary ion mass spectrometry and secondary ion imaging mass spectrometry
Vacuum, 1972Abstract A short survey of the varieties of the Secondary Ion Mass Spectrometry (SIMS) known at present is given. The principle of quantitative analysis with respect to thin film analysis is discussed. The properties of SIMS and SIIMS (Secondary Ion Imaging Mass Spectrometry) are compared with those of Electron Microprobe Analysis.
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Aspects of quantitative secondary ion mass spectrometry
Nuclear Instruments and Methods, 1980Abstract The present state of quantitative secondary ion mass spectrometry (SIMS) is analysed critically. Because of the strong gain in sensitivity obtained by loading the instantaneous sample surface with either oxygen or cesium, chemically enhanced secondary ion emission is discussed almost exclusively.
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Localization of ions in retina by secondary ion mass spectrometry
Experimental Eye Research, 1976Abstract Ionic distribution and localization in tissues is an important aspect of normal retinal physiology and of the pathogenesis of retinal disease. Secondary ion mass spectrometry (SIMS) has been utilized to simultaneously identify and localize ions in retinal tissue.
M B, Bellhorn, R K, Lewis
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Secondary Ion Mass Spectrometry
Annual Review of Materials Science, 1983Secondary ion mass spectrometry (SIMS) is a technique for surface and thin-film analysis with a long history and a mature instrumental base dating from the early 1960s, which nevertheless has only recently achieved broad credibility as an analytical technique. This lack of acceptance stems from the complexity ofthe sputtering and ion emission processes,
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Imaging lipids with secondary ion mass spectrometry
Biochimica et Biophysica Acta (BBA) - Molecular and Cell Biology of Lipids, 2014This review discusses the application of time-of-flight secondary ion mass spectrometry (TOF-SIMS) and magnetic sector SIMS with high lateral resolution performed on a Cameca NanoSIMS 50(L) to imaging lipids. The similarities between the two SIMS approaches and the differences that impart them with complementary strengths are described, and various ...
Mary L, Kraft, Haley A, Klitzing
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Ion neutralisation in secondary ion mass spectrometry
Nuclear Instruments and Methods in Physics Research, 1983Abstract Experiments are described which allow the characteristic velocity of ion neutralisation, A / a , to be measured independent of the secondary ion energy by varying the angle of ion emission and hence the velocity component perpendicular to the surface.
R.F. Garrett +2 more
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Secondary ion mass spectrometry
Vacuum, 1984Abstract The CAMECA IMS 300 instrument uses a primary beam of oxygen, argon or nitrogen ions to give secondary ion emission from the sample surface. The resulting ionic species are identified by mass spectrometry and selectively transmitted to form images of their distribution in the surface of the specimen, or to provide measures of the elemental ...
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Studies of adhesion by secondary ion mass spectrometry
IBM Journal of Research and Development, 1994The study of adhesion requires the characterization of surfaces and interfaces. One surface analytical technique which has been used extensively in the study of adhesion is secondary ion mass spectrometry (SIMS). This paper provides a brief introduction to the basis of this technique and describes the two broad categories of SIMS analyses: static and ...
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