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Studies of adhesion by secondary ion mass spectrometry

IBM Journal of Research and Development, 1994
The study of adhesion requires the characterization of surfaces and interfaces. One surface analytical technique which has been used extensively in the study of adhesion is secondary ion mass spectrometry (SIMS). This paper provides a brief introduction to the basis of this technique and describes the two broad categories of SIMS analyses: static and ...
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Beam optics in secondary ion mass spectrometry

Nuclear Instruments and Methods in Physics Research, 1981
Abstract Secondary ion mass spectrometry (SIMS), a technique for characterizing solids and surfaces, is distinguished by high sensitivity and its applicability to detect all elements. It can be used for surface research, in-depth concentration profiling, isotopic work, and the identification of compounds.
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Secondary ion mass spectrometry in art and archaeology

Thermochimica Acta, 2000
Abstract The continuous demand for new analytical methods for use in studies of relevance to art and archaeology has prompted researchers to investigate the possible applications of a variety of non-conventional and innovative analytical techniques. Secondary ion mass spectrometry was first used in this field in the 1980s and a number of applications
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Molecular secondary ion mass spectrometry

Analytical Chemistry, 1980
R J, Day, S E, Unger, R G, Cooks
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Secondary ion mass spectrometry of organic compounds

TrAC Trends in Analytical Chemistry, 1982
Parent-like secondary ions of the general composition (M+H)+ and (M-H)−, where M stands for an organic molecule, are emitted with very high absolute yields from corresponding molecular layers on solid surfaces during ion bombardment. That was the surprising result of two systematic SIMS investigations of amino acids (1), and further groups of organic ...
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Cellular imaging with secondary ion mass spectrometry

The Analyst, 2009
This article is a concise review of the application of secondary ion mass spectrometry (SIMS) to the imaging of biological cells. The paper covers the various advantages and disadvantages of different approaches to SIMS analysis with respect to the information that can be gained from the interrogation of the cells.
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Lithium Ion Secondary Batteries; Past 10 Years and the Future

Journal of Power Sources, 2001
Y Nishi, Yoshio Nishi
exaly  

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