Results 141 to 150 of about 4,296,477 (284)
Firm turnover under asymmetric information: Tanzania's agro‐dealer sector
Abstract We study firm turnover (i.e., entry and exit) and its consumer implications in a market characterized by asymmetric information. Using a three‐round census of agro‐dealers in Tanzania's Morogoro Region, we document annual firm entry and exit rates of 33% and 17%, respectively.
Alix Naugler +3 more
wiley +1 more source
Robust AI Security and Alignment: A Sisyphean Endeavor? [PDF]
Vassilev A.
europepmc +1 more source
Nonparametric Quantile Regression with Heavy-Tailed and Strongly Dependent Errors [PDF]
We consider nonparametric estimation of the conditional qth quantile for stationary time series. We deal with stationary time series with strong time dependence and heavy tails under the setting of random design.
Toshio Honda
core
Stochastic thermodynamics of social imitation beyond energetics. [PDF]
Irisarri L +3 more
europepmc +1 more source
Area Law for the Entanglement Entropy of Free Fermions in Nonrandom Ergodic Field. [PDF]
Pastur L, Shamis M.
europepmc +1 more source
The statistical analysis of SAXS modelling data allows to identify the critical physicochemical parameters that have an impact on the phase behavior of crude sophorolipid batches. ABSTRACT The aqueous self‐assembly of raw sophorolipid mixtures has been studied by small angle x‐ray scattering (SAXS) to understand the impact of the composition ...
Maia Ouret‐Campagnet +5 more
wiley +1 more source
On Ergodic and Inverse Shadowing Properties of Set-Valued Mapping. [PDF]
Wattan Kamil F, Al-Shara'a IMT.
europepmc +1 more source
A class of strong limit theorems for the sequences of arbitrary random variables
In this paper, the strong limit theorems for arbitrary stochastic sequences are studied. Some convergence theorems for martingale difference sequence and a class of strong limit theorem for countable nonhomogeneous Markov chains are the particular cases ...
Yang, Weiguo, Liu, Wen
core
ABSTRACT The synchronization accuracy between the wafer stage and reticle stage in lithography is critical to overlay and critical dimension uniformity. Existing iterative learning control (ILC) methods indirectly optimize synchronization via time‐domain errors, failing to balance low‐frequency tracking accuracy and high‐frequency noise suppression ...
Xin Zhou +4 more
wiley +1 more source
Quantum estimation with state symmetry-induced optimal measurements. [PDF]
Liu JX, Shi HL, Wu C, Yu S.
europepmc +1 more source

