Results 181 to 187 of about 20,283 (187)

i/sub DDT/ test methodologies for very deep sub-micron CMOS circuits

Ali Chehab
exaly  

Input pattern classification for detection of stuck-ON and bridging faults using I/sub DDQ/ testing in BiCMOS and CMOS circuits

S M Menon, A P Jayasumana, Y K Malaiya   +2 more
exaly  

Analysis of I/sub DDQ/ detectable bridges in combinational CMOS circuits

Eugeni Isern
exaly  

Implementation of concurrent checking circuits by independent sub-circuits

Ilya Levin
exaly  

Static power optimization of deep submicron CMOS circuits for dual V/sub T/ technology

S B K Vrudhula
exaly  

I/sub DD/ waveforms analysis for testing of domino and low voltage static CMOS circuits

exaly  

An efficient test generation technique for sequential circuits with repetitive sub-circuits

exaly