Results 251 to 254 of about 3,551 (254)
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Absorption Edge Determination of Thick GaAs Wafers Using Surface Photovoltage Spectroscopy
Review of Scientific Instruments, 2002Shailendra Kumar +2 more
exaly
Detection of Copper Contamination in Silicon by Surface Photovoltage Diffusion Length Measurements
Applied Physics Letters, 1999exaly

