Results 201 to 210 of about 32,469 (264)

Unveiling the Hidden Geometry of OECTs: Contact‐Semiconductor Overlap Driven Errors in Volumetric Capacitance

open access: yesAdvanced Materials Technologies, EarlyView.
This work examines how contact–semiconductor overlap influences volumetric capacitance extraction in organic electrochemical transistors as device dimensions shrink. It shows that neglecting overlap leads to systematic, geometry‐driven errors in capacitance values.
Renan Colucci   +7 more
wiley   +1 more source

Linguistic experiential priors account for notation-dependent numerical representations. [PDF]

open access: yesCognition
Anceresi G   +4 more
europepmc   +1 more source

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