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Inhibitory control and stress biomarkers in response to social media stimuli: a Go/No-Go study using heart rate variability, alpha-amylase and oxytocin. [PDF]
Front PsychiatryCarbonell-Colomer M +5 more
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Comparison of the Diagnostic Efficacy of Frameless Stereotactic Biopsy (Varioguide) with Other Methods Reported in the Literature: A Single-Center Experience. [PDF]
J Clin Pract ResUlutabanca H +6 more
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Proceedings of the 9th ACM SIGSOFT International Workshop on Automating TEST Case Design, Selection, and Evaluation, 2018
The Internet of Things (IoT) is expected to bring forward new promising solutions in various domains. Consequently, it can impact many aspects of everyday life, and errors can have serious consequences. Despite this, there is a lack of standard testing processes and methods, which poses a major challenge for IoT testing. Nonetheless, closer examination
Pedro Martins Pontes +2 more
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The Internet of Things (IoT) is expected to bring forward new promising solutions in various domains. Consequently, it can impact many aspects of everyday life, and errors can have serious consequences. Despite this, there is a lack of standard testing processes and methods, which poses a major challenge for IoT testing. Nonetheless, closer examination
Pedro Martins Pontes +2 more
openaire +1 more source
Hypercompression of Test Patterns
2018 IEEE International Test Conference (ITC), 2018The paper presents a novel test data compression scheme. This low-silicon-area solution builds on the isometric compression paradigm, but makes it more flexible, elevates encoding efficiency to values unachievable through any conventional type of sequential compression, and ensures high test coverage due to programmable selection of full toggle scan ...
Yu Huang 0005 +4 more
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Evaluating test data for the duration pattern test and pitch pattern test
Speech, Language and Hearing, 2017The purpose of the present study was to evaluate test data for the Duration Pattern test before incorporating this procedure into an auditory processing disorder (APD) test battery at speech and he...
Emily K. Marshall, Alisha L. Jones
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IEEE Transactions on Computers, 1984
Summary: The testing of large logic networks with random patterns is examined. Work by previous workers for single faults is extended to a class of multiple fault situations. Not only is the problem of fault detection in the presence of nonmasking multiple faults treated, but the question of distinguishing between them is also examined.
Jacob Savir, Paul H. Bardell
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Summary: The testing of large logic networks with random patterns is examined. Work by previous workers for single faults is extended to a class of multiple fault situations. Not only is the problem of fault detection in the presence of nonmasking multiple faults treated, but the question of distinguishing between them is also examined.
Jacob Savir, Paul H. Bardell
openaire +2 more sources
Test Pattern Compression Based on Pattern Overlapping
2007 IEEE Design and Diagnostics of Electronic Circuits and Systems, 2007This paper describes a test data compression method based on pattern overlapping. We report here improvements that have been done on the test pattern compaction and compression algorithm called COMPAS. This algorithm reorders and compresses test patterns previously generated in an ATPG in such a way that they are well suited for decompression by the ...
Jiri Jenícek, Ondrej Novák
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Novel test pattern generators for pseudoexhaustive testing
IEEE Transactions on Computers, 2000Pseudoexhaustive testing of a combinational circuit involves applying all possible input patterns to all its individual output cones. The testing ensures detection of all detectable multiple stuck-at faults in the circuit and all detectable combinational faults within individual cones.
Rajagopalan Srinivasan +2 more
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BIST test pattern generators for two-pattern testing-theory and design algorithms
IEEE Transactions on Computers, 1996Summary: Testing for delay and CMOS stuck-open faults requires two-pattern tests, and typically a large number of two pattern tests are needed. Built-In Self-Test (BIST) schemes are attractive for comprehensive testing of such faults. BIST Test Pattern Generators (TPGs) for two-pattern testing, should be designed to ensure high transition coverage.
Chih-Ang Chen, Sandeep K. Gupta 0001
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