Results 281 to 290 of about 20,928,352 (345)
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1993
Anthropomorphic test devices (ATDs), commonly referred to as dummies, are mechanical surrogates of the human that are used by the automotive industry to evaluate the occupant protection potential of various types of restraint systems in simulated collisions of new vehicle designs.
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Anthropomorphic test devices (ATDs), commonly referred to as dummies, are mechanical surrogates of the human that are used by the automotive industry to evaluate the occupant protection potential of various types of restraint systems in simulated collisions of new vehicle designs.
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2023
<div class="section abstract"> <div class="htmlview paragraph">This method covers electric outboards that are rated in terms of static thrust.</div> </div>
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<div class="section abstract"> <div class="htmlview paragraph">This method covers electric outboards that are rated in terms of static thrust.</div> </div>
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Proceedings of the IRE, 1932
A device for showing on a screen the frequency-response curve of a tuned circuit, tuned transformer, amplifier or complete radio set is described in this paper. The action of the device is practically instantaneous, and the effect of circuit adjustments may be seen immediately.
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A device for showing on a screen the frequency-response curve of a tuned circuit, tuned transformer, amplifier or complete radio set is described in this paper. The action of the device is practically instantaneous, and the effect of circuit adjustments may be seen immediately.
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Test device for radiated immunity tests
2009 20th International Zurich Symposium on Electromagnetic Compatibility, 2009A test device for radiated immunity tests has been developed. It allows obtaining a frequency dependent measurement value up to 3.4 GHz instead of a common pass/fail result. The characteristics of this test device have been investigated theoretically by numerical simulations and experimentally in GTEM cells.
Ralf Heinrich +3 more
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A New Dynamic Direct Shear Testing Device on Rock Joints
Rock Mechanics and Rock Engineering, 2020S. Qi +7 more
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Device Testing and Sem Testing Tools
1988The aim of this paper is three fold. In a first part, the basics of electron beam testing are reviewed. Next, a second part details experiences in using electron-beam testing for failure analysis of memories and microprocessors. The third part gives results on the use of an electron beam tester in a more structured methodology for failure analysis and ...
J. P. Collin, B. Courtois
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Integrative oncology: Addressing the global challenges of cancer prevention and treatment
Ca-A Cancer Journal for Clinicians, 2022Jun J Mao,, Msce +2 more
exaly
4720671 Semiconductor device testing device
Microelectronics Reliability, 1988Tetsuo Tada, Keiichi Sawada
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