Results 131 to 140 of about 75,094 (189)

High-Resolution Microscope-Mode Secondary Ion Mass Spectrometry Imaging. [PDF]

open access: yesAnal Chem
Jia Y   +7 more
europepmc   +1 more source

Correction to “Time‐of‐Flight Secondary Ion Mass Spectrometry‐Partial Least Square Regression for Quantifying Interleukin‐8 in Biopolymer Matrices”

open access: yesAdvanced NanoBiomed Research
Ralf Zimmermann   +4 more
doaj   +1 more source

Pore confined time-of-flight secondary ion electrochemical mass spectrometry

Chemical Society Reviews, 2023
This review highlights the important historical and technological developments of in situ ToF-SIEMS technique, especially, the challenges encountered when extending ToF-SIMS from a high vacuum condition to a liquid electrochemical environment.
Jun-Gang Wang   +3 more
openaire   +2 more sources

Secondary ion mass spectrometry by time-of-flight

International Journal of Mass Spectrometry and Ion Physics, 1983
Abstract Some properties of the Manitoba time-of-flight secondary ion mass spectrometer are described and compared with those of other instruments. Topics discussed include properties of the primary ion beam, preparation of small electrosprayed targets, secondary ions from alkali halides (metastable decay and increase in yield after irradiation ...
K.G. Standing   +3 more
openaire   +1 more source

Time-of-flight secondary ion mass spectrometry analyses of vancomycin

Biointerphases, 2018
As an antibiotic that prevents and treats infections caused by Gram-positive bacteria such as Staphylococcus aureus, vancomycin incorporated in a biodegradable polymer poly(lactide-co-glycolide) provides opportunities to construct controlled-release drug delivery systems. Developments associated with this promising system have been largely concentrated
Lin, Du   +10 more
openaire   +2 more sources

Postacquisition Mass Resolution Improvement in Time-of-Flight Secondary Ion Mass Spectrometry

Analytical Chemistry, 2012
Good mass resolution can be difficult to achieve in time-of-flight secondary ion mass spectrometry (TOF-SIMS) when the analysis area is large or when the surface being analyzed is rough. In most cases, a significant improvement in mass resolution can be achieved by postacquisition processing of raw data.
Steven J, Pachuta, Paul R, Vlasak
openaire   +2 more sources

Home - About - Disclaimer - Privacy