Results 141 to 150 of about 75,094 (189)
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Time‐of‐flight secondary ion mass spectrometry of polybutadienes
Surface and Interface Analysis, 1994Abstract High resolution time‐of‐flight secondary ion mass spectrometry was used to study a series of polybutadienes with molecular weights between 400 and 170 000 Da. The number‐averaged and weight‐averaged molecular weights of polybutadienes with molecular weights of <5000 Da were determined and showed ...
Lucinda R. Hittle, David M. Hercules
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Time-of-Flight Secondary Ion Mass Spectrometry
2008Static secondary ion mass spectrometry provides information on the molecular composition of the topmost layer of a sample. It is mostly used as a complementary technique to determine surface composition, surface contamination or surface segregation of components.
Dieter Pleul, Frank Simon
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Time-of-flight secondary ion mass spectrometry of fullerenes
European Journal of Mass Spectrometry, 1995High performance time-of-flight secondary ion mass spectrometry (TOF-SIMS) characterised by high mass resolution and extreme sensitivity has been applied to the analysis of fullerenes. Optimum emission of secondary ions is obtained from silver substrates covered by approximately one monolayer of fullerene. Besides the intact cluster ions C60+, C70+ and
F. Saldi +6 more
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Protein Denaturation Detected by Time-of-Flight Secondary Ion Mass Spectrometry
Langmuir, 2011In the present work we investigate the denaturation of a functional protein, horseradish peroxidase (HRP), under various experimental conditions using time-of-flight secondary ion mass spectrometry. HRP was immobilized on TiO(2), and the samples were stored under different conditions.
Manuela S, Killian +2 more
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Lipid imaging with cluster time-of-flight secondary ion mass spectrometry
Analytical and Bioanalytical Chemistry, 2008This brief article provides an overview of the current state of the art in biological imaging mass spectrometry using cluster time-of-flight secondary ion mass spectrometry (TOF-SIMS). Recent and spectacular improvements in terms of sensitivity of TOF-SIMS imaging methods have allowed many biological applications to recently be successfully tested ...
Brunelle, Alain, Laprévote, Olivier
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Time-of-flight secondary neutral & ion mass spectrometry using swift heavy ions
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2015Abstract We report on a new time-of-flight (TOF) spectrometer designed to investigate sputtering phenomena induced by swift heavy ions in the electronic stopping regime. In this experiment, particular emphasis is put on the detection of secondary ions along with their emitted neutral counterparts in order to examine the ionization efficiency of the ...
Breuer, Lars +4 more
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A pulsed time‐of‐flight mass spectrometer for liquid secondary ion mass spectrometry
Rapid Communications in Mass Spectrometry, 1988Abstract The design and performance of a new time‐of‐flight mass spectrometer is reported. The instrument combines the advantages of a pulsed drawout TOF analyzer with a liquid secondary ion source. Differences from commercially available pulsed TOF analyzers (Wiley/McLaren type) are discussed with regard to operation with ion ...
J K, Olthoff, I A, Lys, R J, Cotter
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Time-of-flight secondary ion mass spectrometry of industrial materials
Analytica Chimica Acta, 1999Abstract Surface phenomena are important in numerous technological areas, such as adhesion, friction, biocompatibility, catalysis, polymer science or composite research. Most of the critical parameters affecting the stability and specific response of industrial products to the environment are controlled by the chemical composition of the uppermost ...
B.A Keller, P Hug
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Time-of-Flight Secondary Ion Mass Spectrometry
2018Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is one of the most powerful surface analysis methods in terms of high sensitivity, high spatial resolution imaging, and detailed chemical information.
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Time-of-flight secondary ion mass spectrometry of polymer materials
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films, 1989Secondary ion formation from polystyrene standards with well-defined molecular weight distributions between 103 and 106 amu has systematically been investigated. Maximum yields of cationized fragments and oligomers are obtained from silver substrates covered by about one monolayer of polymer material. Intact oligomers of polystyrene are detected in the
D. van Leyen +5 more
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