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TOF-SIMS analysis of interplanetary dust
Earth and Planetary Science Letters, 1994Abstract Three interplanetary dust particles (IDPs) collected in the stratosphere were analyzed with imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigate the elemental distribution within these particles at high lateral resolution and to demonstrate the abilities of this new technique for the analysis of IDPs and other ...
Thomas Stephan +4 more
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Silicon (100)/SiO2 by ToF-SIMS
Surface Science Spectra, 2015The authors report the time-of-flight secondary ion mass spectrometry of Si (100)/SiO2. Both positive and negative ion spectra were obtained using a cluster ion source (Bi32+ primary ions at 50 keV). Si+ is the base peak in positive ion mode. The negative ion spectrum shows signals characteristic of the native oxide: SiO2−, SiO2H−, SiO3−, and SiO3H−.
Supriya S. Kanyal +3 more
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ToF-SIMS Study of Polymer Nanocomposites.
MRS Proceedings, 2000ABSTRACTFilms of deuterated polystyrene (dPS) and poly(methyl methacrylate) (PMMA) blends, as well as dPS and PMMA and poly(ethylene-co-propylene) (PEP) blends have been spin-cast from toluene solution and annealed at temperatures above their glass transition temperatures for up to 72 hours.
Vladimir S. Zaitsev +6 more
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1997
Abstract When solid polymers are irradiated with heavy ions, atomic and molecular particles are ejected from the uppermost layers of the surface. A technique to determine the mass spectrum of the charged fraction of these particles is time-of-flight secondary-ion-mass spectrometry, TOF-SIMS.
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Abstract When solid polymers are irradiated with heavy ions, atomic and molecular particles are ejected from the uppermost layers of the surface. A technique to determine the mass spectrum of the charged fraction of these particles is time-of-flight secondary-ion-mass spectrometry, TOF-SIMS.
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Use of TOF-SIMS in Vascular Biology
2013Secondary ion mass spectrometry is a technique used for surface analysis. The recent introduction of metal cluster ionization sources opened the possibility to probe biological tissues, due to its reduced in-source fragmentation. Despite its limitations in mass range of the molecules analyzed, a combination of minimal sample processing, sensibility ...
Sebastián, Mas +2 more
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Characterisation of biomaterials using ToF-SIMS
Fresenius' Journal of Analytical Chemistry, 1999In the field of biomaterials and biological compounds, ToF-SIMS has exhibited large interest due to high surface sensitivity, an information depth limited to the top-surface and molecular imaging capabilities. Selected examples given in this review concern recent applications like characterisation of engineered heterogeneous bioactive surfaces ...
D. Léonard, H. J. Mathieu
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Industrial applications of TOF-SIMS imaging
Proceedings, annual meeting, Electron Microscopy Society of America, 1996Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has in recent years become a useful tool for surface analysis in industrial laboratories. All elements and isotopes, as well as many molecular entities, can be detected by SIMS, with most of the signal coming from the outer 10 - 20 Å of the surface.
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Inferring wettability of heterogeneous surfaces by ToF-SIMS
Journal of Colloid and Interface Science, 2008Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been examined as a possible predictive tool for surface wettability. Heterogeneous surfaces were prepared with hydrophilic and hydrophobic regions of known surface coverage using self-assembled monolayers. The surface coverage of each component was then correlated with ToF-SIMS fragmentation
Craig, Priest +4 more
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Cellular metabolic profiling using ToF‐SIMS
Surface and Interface Analysis, 2012Proteomic and metabolomic changes associated with cellular metabolism are important metabolic indicators that can give insight into cellular function. Metabolites are small molecular weight cellular components of mass typically <1500 Da and well suited for detection using ToF‐SIMS.
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ToF-SIMS Studies of Sulfuric Acid Hydrate Films
The Journal of Physical Chemistry B, 2004A variety of sulfuric acid hydrate films, formed by the co-deposition of SO3 and H2O on a cooled substrate, have been analyzed using time-of-flight secondary ion mass spectrometry (ToF-SIMS). The films were produced using procedures developed in recent infrared spectroscopic studies.
Fletcher, John S. +3 more
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