Results 161 to 170 of about 20,232 (192)
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A ToF‐SIMS study of electrochemical pretreatments for polymers
Surface and Interface Analysis, 2000Time-of-flight SIMS has been used to identify chemical changes caused to hexatriacontane and various hydrocarbon polymers after electrochemical treatment with nitric acid either alone or in the presence of silver ions. The spectra of polypropylene and high-density polyethylene treated in the presence of Ag2+ ions indicated the presence of hydroxyl ...
D. M. Brewis +3 more
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Analysis on nitrogen oxides by TOF-SIMS
Applied Surface Science, 2008Abstract In recent years, influence of gaseous pollutions and pollutants adsorbed on the small particles transferred over the continents and borders may become more serious. Methods used for measuring the pollutants are different and independent for each substance, such as using various physical interactions and chemical reactions.
Miyuki Hashimoto +5 more
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An application of ToF‐SIMS to fine papers
Surface and Interface Analysis, 2006Abstract This paper describes the applicability and limitations of time‐of‐flight secondary ion mass spectroscopy (ToF‐SIMS) for the analysis of paper samples based on studies related to fine papers used in the cigarette industry. The focus was on imaging and appropriate ways of image processing and image analysis.
Sandra Starlinger, Bernhard Eitzinger
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ToF-SIMS Study of Polymer Nanocomposites.
MRS Proceedings, 2000ABSTRACTFilms of deuterated polystyrene (dPS) and poly(methyl methacrylate) (PMMA) blends, as well as dPS and PMMA and poly(ethylene-co-propylene) (PEP) blends have been spin-cast from toluene solution and annealed at temperatures above their glass transition temperatures for up to 72 hours.
Vladimir S. Zaitsev +6 more
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Silicon (100)/SiO2 by ToF-SIMS
Surface Science Spectra, 2015The authors report the time-of-flight secondary ion mass spectrometry of Si (100)/SiO2. Both positive and negative ion spectra were obtained using a cluster ion source (Bi32+ primary ions at 50 keV). Si+ is the base peak in positive ion mode. The negative ion spectrum shows signals characteristic of the native oxide: SiO2−, SiO2H−, SiO3−, and SiO3H−.
Supriya S. Kanyal +3 more
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Tribosurface and lubricant characterization by ToF‐SIMS
Surface and Interface Analysis, 2004Abstract The interaction of moving counterparts with lubricants generates tribosurfaces and tribointerfaces. These tribological boundary layers and their characteristics are important for the lifetime of sliding and rolling bearings. The properties of these structurally and chemically untailored surfaces are of interest for the design
U. Gunst +3 more
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Industrial applications of TOF-SIMS imaging
Proceedings, annual meeting, Electron Microscopy Society of America, 1996Time-of-flight secondary ion mass spectrometry (TOF-SIMS) has in recent years become a useful tool for surface analysis in industrial laboratories. All elements and isotopes, as well as many molecular entities, can be detected by SIMS, with most of the signal coming from the outer 10 - 20 Å of the surface.
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Molecular surface analysis by TOF-SIMS
Proceedings, annual meeting, Electron Microscopy Society of America, 1992Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2.
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TOF-SIMS analysis of hydrogen in steels
Das Bestreben, Stahl mit optimierter Leistung und Korrosionsbeständigkeit zu entwickeln, stellt einen kontinuierlichen Prozess in der Industrie dar. Die Anwesenheit von Wasserstoff, insbesondere in verzinkten Dualphasenstählen (DP), spielt eine entscheidende Rolle bei der Erreichung der gewünschten Materialeigenschaften, wie Anfälligkeit für ...openaire +1 more source

