Results 151 to 160 of about 20,232 (192)
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Planetary and Space Science, 2001
Abstract Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a decade ago. Major advantages of TOF-SIMS compared to other ion microprobe techniques are (a) parallel detection of all secondary ions with one polarity in a single measurement—both polarities in subsequent analyses, (b) high lateral ...
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Abstract Time-of-flight secondary ion mass spectrometry (TOF-SIMS) was introduced into cosmochemistry about a decade ago. Major advantages of TOF-SIMS compared to other ion microprobe techniques are (a) parallel detection of all secondary ions with one polarity in a single measurement—both polarities in subsequent analyses, (b) high lateral ...
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Imaging TOF-SIMS analysis of oligonucleotide microarrays
The Analyst, 2002Single strand thiolated oligonucleotide (25-mer) was printed onto chemically modified glass and silicon surfaces. Confirmation of the level of attachment attained in each case was effected through detection by conventional confocal fluorescence microscopy.
Larisa-Emilia, Cheran +2 more
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Calcium distributions in human hair by ToF-SIMS
Biochimica et Biophysica Acta (BBA) - General Subjects, 2003Calcium distributions on internal and external surfaces of longitudinally sectioned hairs were analysed with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Externally, calcium deposits were observed at the cuticle scale edges. Internal sections showed that the bulk of calcium exists within or just inside the cuticle layer.
I M, Kempson +2 more
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Characterization of supported Nb catalysts by ToF-SIMS
Surface and Interface Analysis, 2000A series of Nb2O5/TiO2 catalysts were prepared by incipient wetness impregnation of TiO2 with aqueous solutions of niobium oxalate/oxalic acid. Eight different catalysts with Nb loadings of 0.48–8.5 wt.% Nb were prepared. Analysis of the time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra of Nb2O5/TiO2 catalysts shows the presence of ...
Saeed B. Bukallah +2 more
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TOF‐SIMS study of cystine and cholesterol stones
Journal of Mass Spectrometry, 2012Two different human stones, cystine and cholesterol from the kidney and gall bladder, were examined by time‐of‐flight secondary ion mass spectrometry using Ga+ primary ions as bombarding particles. The mass spectra of kidney stone were compared with those measured for the standard compounds, cystine and cysteine.
C A A, Ghumman +4 more
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1997
Abstract When solid polymers are irradiated with heavy ions, atomic and molecular particles are ejected from the uppermost layers of the surface. A technique to determine the mass spectrum of the charged fraction of these particles is time-of-flight secondary-ion-mass spectrometry, TOF-SIMS.
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Abstract When solid polymers are irradiated with heavy ions, atomic and molecular particles are ejected from the uppermost layers of the surface. A technique to determine the mass spectrum of the charged fraction of these particles is time-of-flight secondary-ion-mass spectrometry, TOF-SIMS.
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TOF-SIMS investigations on weathered silver surfaces
Analytical and Bioanalytical Chemistry, 2007Silver-coated quartz crystal microbalance (QCM) disks were treated under different environmental conditions (including changes in parameters such as relative humidity (%RH) and SO(2)/H(2)S content) in atmospheres of synthetic air and pure N(2) for 24 h in a weathering chamber. The corroded surfaces were subjected to depth profiling by a time of flight (
J, Schnöller +5 more
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ToF‐SIMS characterization of microplastics in soils
Surface and Interface Analysis, 2020Microplastics pollution is becoming one of the most serious threats to the surface ecosystem of the earth; it is widespread in oceans, rivers, sediments, soils, and organisms. It is a growing concern as an environmental pollutant, which currently has no clear detection standard.
Chuan Du +4 more
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Application of TOF-SIMS to microelectronics
Proceedings of 4th International Conference on Solid-State and IC Technology, 2002Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful tool for the study of surface chemical contamination. State-of-the-art TOF-SIMS instruments are capable of detection limits in the ppm regime and spatial resolution on the order of 200 nm.
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TOF-SIMS analysis of interplanetary dust
Earth and Planetary Science Letters, 1994Abstract Three interplanetary dust particles (IDPs) collected in the stratosphere were analyzed with imaging time-of-flight secondary ion mass spectrometry (TOF-SIMS) to investigate the elemental distribution within these particles at high lateral resolution and to demonstrate the abilities of this new technique for the analysis of IDPs and other ...
Thomas Stephan +4 more
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