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Examination of gunshot residues transfer using ToF‐SIMS
Surface and Interface Analysis, 2012It has been proved that time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a very effective technique enabling detection of traces of gunshot residues (GSRs) which are usually transferred from the palm (fingers) of an attendant of criminal scene on a primary base, e.g. top of table, glass and mobile phone.
Szynkowska, Małgorzata Iwona +3 more
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Calcium distributions in human hair by ToF-SIMS
Biochimica et Biophysica Acta (BBA) - General Subjects, 2003Calcium distributions on internal and external surfaces of longitudinally sectioned hairs were analysed with Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS). Externally, calcium deposits were observed at the cuticle scale edges. Internal sections showed that the bulk of calcium exists within or just inside the cuticle layer.
I M, Kempson +2 more
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Characterization of supported Nb catalysts by ToF-SIMS
Surface and Interface Analysis, 2000A series of Nb2O5/TiO2 catalysts were prepared by incipient wetness impregnation of TiO2 with aqueous solutions of niobium oxalate/oxalic acid. Eight different catalysts with Nb loadings of 0.48–8.5 wt.% Nb were prepared. Analysis of the time-of-flight secondary ion mass spectrometry (ToF-SIMS) spectra of Nb2O5/TiO2 catalysts shows the presence of ...
Saeed B. Bukallah +2 more
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TOF‐SIMS study of cystine and cholesterol stones
Journal of Mass Spectrometry, 2012Two different human stones, cystine and cholesterol from the kidney and gall bladder, were examined by time‐of‐flight secondary ion mass spectrometry using Ga+ primary ions as bombarding particles. The mass spectra of kidney stone were compared with those measured for the standard compounds, cystine and cysteine.
C A A, Ghumman +4 more
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ToF-SIMS PCA analysis of Myrtus communis L.
Applied Surface Science, 2009Abstract Nowadays there is a growing interest of researchers for the application of sophisticated analytical techniques in conjunction with statistical data analysis methods to the characterization of natural products to assure their authenticity and quality, and for the possibility of direct analysis of food to obtain maximum information.
PIRAS F. M +2 more
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Ion extraction from insulating fibers in ToF‐SIMS
Surface and Interface Analysis, 1999Extraction of ions in a triple focusing time-of-flight secondary ion mass spectroscopy system is studied as a function of substrate potential with samples consisting of insulating dielectric fibers mounted on a metallic substrate. It is determined that ions extracted from the surfaces of the dielectric require, in general, a higher substrate potential ...
Recep Avci +5 more
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Application of TOF-SIMS to microelectronics
Proceedings of 4th International Conference on Solid-State and IC Technology, 2002Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a powerful tool for the study of surface chemical contamination. State-of-the-art TOF-SIMS instruments are capable of detection limits in the ppm regime and spatial resolution on the order of 200 nm.
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Molecular surface analysis by TOF-SIMS
Proceedings, annual meeting, Electron Microscopy Society of America, 1992Time-of-flight secondary ion mass spectrometry (TOF-SIMS) performs surface sensitive analysis of the elemental and molecular composition of solids. TOFSIMS is a relatively new embodiment of static secondary ion mass spectrometry (SSIMS) in which the dose of primary ions incident on the surface is typically less than 1012 ions/cm2.
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