Isotope analysis in the transmission electron microscope [PDF]
Electron microscopy can reveal a material’s chemical structure down to the atomic level, but has so far been blind to isotopic differences. Here the authors are able to map isotope concentrations in graphene by measuring the probability of ejecting atoms,
Toma Susi +7 more
doaj +7 more sources
Direct imaging of electron density with a scanning transmission electron microscope [PDF]
Recent studies of secondary electron (SE) emission in scanning transmission electron microscopes suggest that material’s properties such as electrical conductivity, connectivity, and work function can be probed with atomic scale resolution using a ...
Ondrej Dyck +8 more
doaj +2 more sources
Operando two-terminal devices inside a transmission electron microscope [PDF]
Advanced nanomaterials are at the core of innovation for the microelectronics industry. Designing, characterizing, and testing two-terminal devices, such as metal-insulator-metal structures, is key to improving material stack design and integration ...
Oscar Recalde-Benitez +14 more
doaj +2 more sources
A nanofabricated, monolithic, path-separated electron interferometer [PDF]
Progress in nanofabrication technology has enabled the development of numerous electron optic elements for enhancing image contrast and manipulating electron wave functions.
Akshay Agarwal +4 more
doaj +3 more sources
Exploring the environmental transmission electron microscope [PDF]
The increasing interest and development in the field of in situ techniques have now reached a level where the idea of performing measurements under near realistic conditions has become feasible for transmission electron microscopy (TEM) while maintaining high spatial resolution. In this paper, some of the opportunities that the environmental TEM (ETEM)
Ajayan +39 more
core +5 more sources
Correction: Corrigendum: Isotope analysis in the transmission electron microscope [PDF]
Nature Communications 7: Article number: 13040 (2016); Published: 10 October 2016; Updated: 30 August 2017 This Article contains typographical errors in Fig. 3 and Equation 23. In Fig. 3c, the labels ‘12C’ and ‘13C’ in the key should be reversed.
Toma Susi +7 more
doaj +2 more sources
Probing microwave fields and enabling in-situ experiments in a transmission electron microscope. [PDF]
A technique is presented whereby the performance of a microwave device is evaluated by mapping local field distributions using Lorentz transmission electron microscopy (L-TEM).
Goncalves FJT +6 more
europepmc +5 more sources
In-Situ Stretching Patterned Graphene Nanoribbons in the Transmission Electron Microscope [PDF]
The mechanical response of patterned graphene nanoribbons (GNRs) with a width less than 100 nm was studied in-situ using quantitative tensile testing in a transmission electron microscope (TEM).
Zhongquan Liao +10 more
doaj +2 more sources
Spatial–temporal characterization of photoemission in a streak-mode dynamic transmission electron microscope [PDF]
A long-standing motivation driving high-speed electron microscopy development is to capture phase transformations and material dynamics in real time with high spatial and temporal resolution.
Samik Roy Moulik +5 more
doaj +2 more sources
Comparing Scanning Electron Microscope and Transmission Electron Microscope Grain Mapping Techniques Applied to Well-Defined and Highly Irregular Nanoparticles [PDF]
Ruperto G. Mariano +4 more
doaj +2 more sources

