Results 261 to 270 of about 1,266,887 (331)

An environmental cell transmission electron microscope

Review of Scientific Instruments, 1990
An aperture-limited, differentially pumped environmental cell has been developed and installed in a JEOL 4000 EX electron microscope. With this environmental cell it is possible to observe, at high spatial resolution, the detailed changes in microstructure that occur during the interaction between a solid and a gaseous environment.
D.K. Dewald, T.C. Lee, J.A. Eades, I.M. Robertson, H.K. Bimbaum   +4 more
openaire   +1 more source

High-speed transmission electron microscope

Review of Scientific Instruments, 2003
A high-speed transmission electron microscope was developed for probing laser-induced fast nonperiodical processes on the nanosecond time scale. 7–11 ns illuminating electron pulses—up to three—are produced by a laser pulse-driven photocathode. The electron gun can be used both for nanosecond exposure and conventional stationary operation.
H. Dömer, O. Bostanjoglo
openaire   +1 more source

The Transmission Electron Microscope

1996
A typical commercial transmission electron microscope (TEM) costs about $5 for each electron volt (eV) of energy in the beam and, if you add on all available options, it can easily cost up to $10 per eV. As you’ll see, we use beam energies in the range from 100,000 to 400,000 eV, so a TEMis an extremely expensive piece of equipment. Consequently, there
David B. Williams, C. Barry Carter
openaire   +1 more source

Tracking single adatoms in liquid in a transmission electron microscope

Nature, 2022
Nick Clark, D. Kelly, Mingwei Zhou, Y. Zou, C. Myung, D. Hopkinson, Christoph Schran, A. Michaelides, R. Gorbachev, S. Haigh   +9 more
semanticscholar   +1 more source

Topographical contrast in the transmission electron microscope

Ultramicroscopy, 1975
An adaptation of the Foucault method for topographical imaging in the transmission electron microscope is described in detail. The image contrast is produced by selection of electrons which have suffered differential phase retardations in the specimen inner potential.
A G, Cullis, D M, Maher
openaire   +2 more sources

The Transmission Electron Microscope

1998
This chapter gives a short description of the physical instrumentation of the transmission electron microscope (fixed beam and scanning modes). It starts with the fundamental physics of electron dynamics for energies in the range 100–1000 keV. Some types of magnetic lenses and aberration correctors used to focus the electrons in the microscope are ...
openaire   +1 more source

Transmission Electron Analyzing Microscope (Team) and Scanning Transmission Eiectron Analyzing Microscope (Steam)

Proceedings, annual meeting, Electron Microscopy Society of America, 1972
After much difficulty in attempting to measure accurately electron intensities in a conventional transmission electron microscope, it was decided that a quantitative electron analyzing capacility should be designed. Such an instrument should be capable of analyzing both the number and energy of electrons at any point in an image or diffraction pattern.
C. D. Melvin, J. W. Sprys
openaire   +1 more source

Lithium whisker growth and stress generation in an in situ atomic force microscope–environmental transmission electron microscope set-up

Nature Nanotechnology, 2020
Liqiang Zhang, Ting-ting Yang, C. Du, Qiunan Liu, Yushu Tang, Jun Zhao, Baolin Wang, Tianwu Chen, Yong Sun, P. Jia, Hui Li, Lin Geng, Jingzhao Chen, Hongjun Ye, Zaifa Wang, Yanshuai Li, Haiming Sun, Xiaomei Li, Qiushi Dai, Yongfu Tang, Qiuming Peng, T. Shen, Sulin Zhang, T. Zhu, Jianyu Huang   +24 more
semanticscholar   +1 more source

The Scanning Transmission Electron Microscope

2008
The scanning transmission electron microscope (STEM) was a rediscovery or reinvention whose conception was based on techniques and processes in nuclear physics, and it was lamentably ignorant of any precedent. This chapter is concerns the principles of operation of the STEM, paying particular attention to the limits of performance, it is helpful first ...
Albert V. Crewe, Peter D. Nellist
openaire   +1 more source

TRANSMISSION ELECTRON MICROSCOPE (TEM)

2021
Transmission Electron Microscopy (TEM) is used for the simultaneous determination of micro/nano and crystal structure of inorganic and organic materials. Devices with lanthanum hexaboride (LaB6) electron gun operating under accelerating voltage in the range of 40-200 kV are particularly suitable for imaging biological, polymeric and nano-structured ...
openaire   +1 more source