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Quantitative analysis of hydrogen in thin films using TOF ERDA spectroscopy
Thin solid films, 2010Determination of atomic concentrations in thin films is one of key problems in materials science. Time-of-Flight Elastic Recoil Detection Analysis (TOF ERDA) is a powerful method for depth profiling of light and medium mass elements in near surface layers of material.
Jakšić, Milko +2 more
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Application of μRBS/ERDA system in microstructured devices
Nuclear Instruments & Methods in Physics Research B, 2021Shigeo Matsuyama, S Toyama
exaly
Use of Reserve/Resource Estimates by National ERDA Laboratory: ABSTRACT
AAPG Bulletin, 1977openaire +1 more source
Depth Profiling of Light Elements in Solid State Ionics Materials Using ERDA and TOF-ERDA
Takuya Majima, Keisuke Yasudaopenaire +1 more source
Development of a high mass-resolution TOF-ERDA system for a wide mass range
Nuclear Instruments & Methods in Physics Research B, 1997Shinjiro Hayakawa +2 more
exaly
Light element analysis in amorphous and nanocrystalline silicon using ERDA and related techniques
2006In this work, investigation of light elements incorporated in the amorphous silicon network of hydrogenated and nanocrystalline silicon were analysed by using ion beam analytical techniques. To do this, amorphous silicon films were deposited by hot wire chemical vapour deposition, and a unique sampling method was developed for the analysis of ...
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Development of an in-air ERDA system for hydrogen analysis
Nuclear Instruments & Methods in Physics Research B, 2019Kohtaku Suzuki
exaly
Development of external coincidence ERDA: Hydrogen analysis of moist samples
Nuclear Instruments & Methods in Physics Research B, 2019Masahiro Saito, H Hofsäss
exaly
Intensity calibration of an FT-IR spectrometer by heavy-ion ERDA
Nuclear Instruments & Methods in Physics Research B, 2004Marcus Bar, Erik Strub, W Bohne
exaly