Results 101 to 107 of about 5,407,858 (107)

Electromigration reliability of tungsten and aluminum vias and improvements under AC current stress

IEEE Transactions on Electron Devices, 1993
N W Cheung
exaly  

Resistance Determination for Sub-100-nm Carbon Nanotube Vias

IEEE Electron Device Letters, 2015
Changjian Zhou, Anshul A Vyas, Mansun Chan   +2 more
exaly  

Morfologia das vias aéreas superiores em pacientes com síndrome de Down sob sedação com dexmedetomidina

Revista Brasileira De Anestesiologia, 2016
, Robert J Fleck, Rupa Radhakrishnan
exaly  

Reliability challenges for barrier/liner system in high aspect ratio through silicon vias

Microelectronics Reliability, 2014
Yunlong Li, Stefaan Van Huylenbroeck, Els Van Besien   +2 more
exaly  

New Vias in DBC

Microelectronics International, 2000
exaly  

Contacts and Vias

2016
exaly  

Signal Integrity Analysis Between Continuous Vias and Indirect Vias on RDL Circuits

exaly