Results 71 to 80 of about 121,840 (219)

Obfuscation of combination circuits of digital devices from unauthorized access

open access: yesInformatika, 2019
The problems of designing modern VLSI and SoC are analyzed. The most difficult problems of design are problems of verification of projects at different stages of design.
L. A. Zolotorevich
doaj  

Construction of Neural Network Classification Expert Systems Using Switching Theory Algorithms [PDF]

open access: yes, 1992
A new family of neural network architectures is presented. This family of architectures solves the problem of constructing and training minimal neural network classification expert systems by using switching theory.
Jaskolski, John V.
core   +1 more source

Bioelectronic Technology for Nutritional Research—a Novel In Vitro Platform for a Better Understanding of Human Gut Barrier Absorption

open access: yesAdvanced Biology, Volume 10, Issue 2, February 2026.
This is the first study to demonstrate that the e‐transmembrane gut model provides more accurate physiological predictions than conventional cell culture inserts when tested by the dietary compound butyrate. The bioelectronic e‐transmembrane platform integrates technological and biological optimizations, enabling the hosting of a complex human gut in ...
Verena Stoeger   +12 more
wiley   +1 more source

Additive effects under the series of EOS in space application VLSI circuits

open access: yesMATEC Web of Conferences, 2017
One of the problems of space technology is the spacecraft on orbit charging effect. Series of EOS (electrical overstress) are caused by internal charging affect VLSI (very large-scale integrated) circuits, which may lead to its damage. The results of the
Diatlov Nikolai   +2 more
doaj   +1 more source

A VLSI-design of the minimum entropy neuron [PDF]

open access: yes, 2010
One of the most interesting domains of feedforward networks is the processing of sensor signals. There do exist some networks which extract most of the information by implementing the maximum entropy principle for Gaussian sources.
Brause, Rüdiger W.
core  

Unveiling Phonon Contributions to Thermal Conductivity and the Applicability of the Wiedemann—Franz Law in Ruthenium and Tungsten Thin Films

open access: yesAdvanced Functional Materials, Volume 36, Issue 12, 9 February 2026.
Thermal transport in Ru and W thin films is studied using steady‐state thermoreflectance, ultrafast pump–probe spectroscopy, infrared‐visible spectroscopy, and computations. Significant Lorenz number deviations reveal strong phonon contributions, reaching 45% in Ru and 62% in W.
Md. Rafiqul Islam   +14 more
wiley   +1 more source

A Systematic Review of Compressive Sensing: Concepts, Implementations and Applications

open access: yesIEEE Access, 2018
Compressive Sensing (CS) is a new sensing modality, which compresses the signal being acquired at the time of sensing. Signals can have sparse or compressible representation either in original domain or in some transform domain.
Meenu Rani, S. B. Dhok, R. B. Deshmukh
doaj   +1 more source

Ultra high speed image processing techniques [PDF]

open access: yes
Packaging techniques for ultra high speed image processing were developed. These techniques involve the development of a signal feedthrough technique through LSI/VLSI sapphire substrates.
Anthony, T.   +4 more
core   +1 more source

Implementation of Special Function Unit for Vertex Shader Processor Using Hybrid Number System

open access: yesJournal of Computer Networks and Communications, 2014
The world of 3D graphic computing has undergone a revolution in the recent past, making devices more computationally intensive, providing high-end imaging to the user. The OpenGL ES Standard documents the requirements of graphic processing unit.
Avni Agarwal   +3 more
doaj   +1 more source

On testing VLSI chips for the big Viterbi decoder [PDF]

open access: yes
A general technique that can be used in testing very large scale integrated (VLSI) chips for the Big Viterbi Decoder (BVD) system is described. The test technique is divided into functional testing and fault-coverage testing.
Hsu, I. S.
core   +1 more source

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