Results 41 to 50 of about 1,545 (212)

Computation of the zero-wire current under an asymmetric nonlinear load in a distribution network

open access: yesEnergy Reports, 2022
Recently the electrical receivers with a nonlinear volt–ampere characteristic have increased significantly in utility electrical networks. The authors suggest applying a detailed account of their characteristics to analyze asymmetric/non-sinusoidal ...
Shokhin Dzhuraev   +6 more
doaj   +1 more source

VOLT-AMPERE FEATURES OF SILVER SULFIDE [PDF]

open access: yes, 2019
Features of ionic/electronic conductivity were considered on the example of silver sulfide. Measured volt-ampere characteristic was used to understand the charge transfer mechanism in silver sulfide at ambient ...
Ремпель, А. А.   +2 more
core  

FastCat: Autonomous Discovery of Multielement Layered Double Hydroxide Alloy Catalysts for Alkaline Oxygen Evolution Reaction

open access: yesAdvanced Intelligent Discovery, EarlyView.
A machine learning‐guided self‐driving laboratory screened over 500 nickel‐based layered double‐hydroxide catalysts for alkaline oxygen evolution. Out of the eight metals, the robot uncovered a quaternary Ni–Fe–Cr–Co catalysts requiring only 231 mV overpotential to reach 20 mA cm−2.
Nis Fisker‐Bødker   +3 more
wiley   +1 more source

Device for automatic measurement of volt-ampere characteristics

open access: yes, 2020
The Master's thesis discusses the design and realization of electronic meter of volt-ampere characteristics using Wifi module ESP32. The device is designed to be able to measure the characteristic in the voltage range of +/- 20 V and current range of +/-
Ondráček, Petr
core   +1 more source

The effect of a hybrid coating of porous silicon and WS2 and MoS2 quantum dots on the electrical characteristics of photosensitive structures

open access: yesФизика волновых процессов и радиотехнические системы
Background. This paper examines the effect of the hybrid coating of quantum dots and porous silicon on the volt-ampere characteristic of photosensitive structures.
Natalia A. Poluektova   +2 more
doaj   +1 more source

A DC Series Arc Fault Detection Method Using Line Current and Supply Voltage

open access: yesIEEE Access, 2020
In recent years, DC fault arc detection has been an electrical engineering research hotspot. At present, most proposed detection methods do not analyze the effects of fault arc electrical characteristics on both line current and supply voltage. Therefore,
Qiwei Lu   +5 more
doaj   +1 more source

Volt-Ampere characteristic of "black box" with a negative resistance

open access: yes, 2016
This problem was given at Third Experimental Physics Olympiad "The day of the resistor", 31 October 2015, Kumanovo, organized by the Regional Society of Physicists of Strumica, Macedonia and the Sofia Branch of the Union of Physicists in Bulgaria.
Manolev, Stojan G.   +3 more
openaire   +2 more sources

The Interoperability Challenge in DFT Workflows Across Implementations

open access: yesAdvanced Intelligent Discovery, EarlyView.
Interoperability and cross‐validation remain major challenges in the computational materials science. In this work, we introduce a common input/output standard that enables internal translation across multiple workflow managers—AiiDA, PerQueue, Pipeline Pilot, and SimStack—while producing results in a unified schema.
Simon K. Steensen   +13 more
wiley   +1 more source

Impact of the thickness of phthalocyanine films and its metal complexes on optical and electrical properties

open access: yesҚарағанды университетінің хабаршысы. Физика сериясы, 2023
The paper presents the results of a study of the structural, optical and electrophysical characteristics of phthalocyanine films and its metal complexes with different thicknesses.
С.К. Тажибаев   +6 more
doaj   +1 more source

Tandem Neural Network Rapidly Solves Multivalued Inverse Problems: Application to Oxide‐Semiconductor Characterization

open access: yesAdvanced Intelligent Systems, EarlyView.
A tandem neural network directly solves the multivalued inverse problem of extracting semiconductor parameters from transistor measurements. Trained on only 1000 simulations, the network infers six material parameters (e.g., defect states, carrier concentration, mobility) in under 1 ms, demonstrating a broadly applicable framework for semiconductor ...
Masatoshi Kimura   +8 more
wiley   +1 more source

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