Results 11 to 20 of about 651 (161)

Memristor Degradation Analysis Using Auxiliary Volt-Ampere Characteristics [PDF]

open access: yesMicromachines, 2022
The memristor is one of the modern microelectronics key devices. Due to the nanometer scale and complex processes physic, the development of memristor state study approaches faces limitations of classical methods to observe the processes.
Georgy Teplov   +8 more
doaj   +4 more sources

Bistability of AlGaAs/GaAs Resonant-Tunneling Diodes Heterostructural Channel [PDF]

open access: yesSensors, 2023
This paper presents an effective compact model of current transfer for the estimation of hysteresis parameters on the volt-ampere characteristics of resonant-tunneling diodes.
Natalia Vetrova   +5 more
doaj   +2 more sources

A Study of the Applicability of Existing Compact Models to the Simulation of Memristive Structures Characteristics on Low-Dimensional Materials [PDF]

open access: yesMicromachines, 2021
The use of low-dimensional materials is a promising approach to improve the key characteristics of memristors. The development process includes modeling, but the question of the most common compact model applicability to the modeling of device ...
Fedor Pavlovich Meshchaninov   +5 more
doaj   +2 more sources

Breakdown, scaling and volt–ampere characteristics of low current micro-discharges [PDF]

open access: yesJournal of Physics D: Applied Physics, 2008
We give preliminary results on the breakdown and low current limit of volt‐ampere characteristics of simple parallel plate non-equilibrium dc discharges at standard (centimetre size) and micro-discharge conditions. Experiments with micro-discharges are reported attempting to establish the maintenance of E/N, pd and j/p 2 scalings at small dimensions ...
Z Lj Petrović   +6 more
openaire   +3 more sources

Obtaining new types of compounds between silicon and cadmium sulfide [PDF]

open access: yesE3S Web of Conferences, 2023
The n+CdS-nCdS-nSi+ structures were obtained, and their volt-ampere characteristics at different temperatures were studied. The dependence of the volt-ampere characteristic shows that the sublinear and quadratic section of these structures has a section ...
Sapaev I. B.
doaj   +3 more sources

Application of numerical and graphical methods of analysis in nonlinear resistive circuits of electronic devices [PDF]

open access: yesE3S Web of Conferences, 2023
The article discusses the research issues and methods of analysis of semiconductor circuits used in electronic circuits of contactless switching devices, provides analytical, graphic and numerical methods for the analysis of nonlinear semiconductor ...
Abduraimov Erkin, Nurmatov Baxtiyor
doaj   +1 more source

The properties of metal contacts on TiO2 thin films produced by reactive magnetron sputtering [PDF]

open access: yesТехнологія та конструювання в електронній апаратурі, 2010
The article deals with research on volt-ampere characteristics of metal contacts (Al, Cr, In, Mo, Ti) on titanium dioxide thin films and influence of annealing in vacuum on their electric properties. Volt-ampere characteristics measurements were taken by
В. В. Брус   +4 more
doaj   +1 more source

Volt-ampere characteristics of porcine retinal Müller cell intermediate filaments

open access: yesChemical Physics, 2020
Abstract In the current study we reported current-voltage (I/V) characteristics of Muller cell (MC) intermediate filaments (IFs) isolated from porcine retina. It was found that the measured I/V dependences demonstrate behavior of a semiconductor in contact with metal (Au) electrodes.
Vladimir Makarov, Igor Khmelinskii
openaire   +3 more sources

WEB APPLICATION FOR HIGH ACCURANCY MEASUREMENT OF VOLT-AMPERE CHARACTERISTICS

open access: yesSystem technologies, 2021
Web application is described that allows, by scanning digital images of analog oscillograms of voltage and current pulses, to measure with high accuracy the volt-ampere characteristics of semiconductor materials at high electric currents. The application allows measuring voltage and current with a relative error that does not exceed  1%.
Alexander Ivon   +2 more
openaire   +2 more sources

Detection of Short-Circuited Turns in Secondary Windings of Current Transformers Using Method of Digital Current and Voltage Oscillography While Reading Volt-Ampere Characteristics

open access: yesИзвестия высших учебных заведений и энергетических объединенний СНГ: Энергетика, 2004
The paper contains processing results of digital current and voltage oscillograms as effective, mean and peak volt-ampere characteristics of a serviceable current transformer with short- circuited turns.
V. Kh. Sapyanik   +2 more
doaj   +1 more source

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