Results 41 to 50 of about 651 (161)

Volt-Ampere Characteristics of Hetero Film Photosensitive Structure Au-CdS-nSi-CdTe-Au

open access: yesEast European Journal of Physics
The results of studies of the current-voltage characteristics of a photodiode heterostructure are presented. Au-nCdS-nSi-pCdTe-Au, in forward and reverse directions.
Sharifa B. Utamuradova   +5 more
doaj   +1 more source

Experimental Modeling of the Electron Beam Focusing Regimesin the Axially-Symmetric Systems [PDF]

open access: yesЖурнал нано- та електронної фізики, 2014
The paper describes the results of the experimental research of the volt-ampere characteristics of the three-electrode electron gun. Such systems are widely used in the electron-ray devices meant for getting visible image on the screen, and in microwave ...
I.V. Barsuk   +2 more
doaj  

AUTOMATED INFORMATION-MEASURING SYSTEM FOR MEASUREMENT OF VOLTAGE CHARACTERISTICS OF SEMICONDUCTOR STRUCTURES

open access: yesИзмерение, мониторинг, управление, контроль
Background. Structures based on semiconductor materials are widely used in nano- and microelectronics devices. One of the promising directions is related to the production and research of transparent conductive films and structures based on them.
E.A. Pecherskaya   +5 more
doaj   +1 more source

Study on variations in moisture-affected fault characteristics of EMU lightning arrester

open access: yes机车电传动, 2023
In order to study the changes in the fault characteristics of the EMU lightning arresters exposed to moisture, an artificial moisture test platform of lightning arresters was built, on which the lightning arrester can be controlled to reach three states ...
LIU Jian   +5 more
doaj  

Volt-ampere Characteristics of Metal-semiconductor Rectifier Diodes. Part 2. Volt-ampere Characteristics of Metal-semiconductor Diodes

open access: yesENERGETIKA. Proceedings of CIS higher education institutions and power engineering associations
The volt-ampere characteristics of different diodes and zener diodes are obtained experimentally, and they differ significantly from experience to experience. It is unclear how to properly substantiate the reason for such differences. In this regard, a problem arose in developing the theoretical foundations for the production of this type of equipment ...
openaire   +1 more source

Volt-Ampere characteristic of "black box" with a negative resistance

open access: yes, 2016
This problem was given at Third Experimental Physics Olympiad "The day of the resistor", 31 October 2015, Kumanovo, organized by the Regional Society of Physicists of Strumica, Macedonia and the Sofia Branch of the Union of Physicists in Bulgaria.
Manolev, Stojan G.   +3 more
openaire   +2 more sources

RESEARCH OF VOLTAMPER CHARACTERISTICS OF SEMICONDUCTOR STRUCTURES AND DEVICES

open access: yesИзмерение, мониторинг, управление, контроль
Background. The object of study is an automated measuring system designed to measure the electrical parameters of semiconductor structures and devices.
E.A. Pecherskaya   +5 more
doaj   +1 more source

Investigation of Volt-Ampere Characteristics of a Gas Sensitive Sensor Based on Tin Dioxide

open access: yesEast European Journal of Physics
The volt-ampere characteristics of the sensitive elements of gas sensors are investigated and plotted in coordinates corresponding to various mechanisms of the transfer current. It has been established that the prevailing mechanism of current transfer in
Sirajidin Z. Zainabidinov   +4 more
doaj   +1 more source

RADIATION RESISTANCE SIMULATION OF LOGICAL CMOS INTEGRATED CIRCUITS ELEMENTS

open access: yesДоклады Белорусского государственного университета информатики и радиоэлектроники, 2019
The software to simulate radiation resistance of MOSFET transistors, the basic elements of CMOS integrated circuits, is presented. The software performs visualization and analysis of volt-ampere characteristics of p - and n -channel transistors ...
A. P. Lazar, F. P. Korshunov
doaj  

Measuring. Monitoring. Management. Control

open access: yesИзмерение, мониторинг, управление, контроль
Background. Currently, semiconductor structures and devices are used in many industries, in particular electronics, telecommunications, and instrumentation.
E.A. Pecherskaya   +4 more
doaj   +1 more source

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