Results 251 to 260 of about 364,432 (293)

Instrumentation for soft X-ray emission spectroscopy

Journal of Electron Spectroscopy and Related Phenomena, 2000
Abstract An account is presented of developments in instrumentation for soft X-ray emission spectroscopy (SXES) based on synchrotron radiation. An account for grating spectrometers for soft X-ray emission spectroscopy is given, and some considerations regarding synchrotron radiation applications of the spectroscopy are presented.
Joseph Nordgren, Jinghua Guo
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Problems in X-ray emission spectroscopy

Ultramicroscopy, 1989
During the Analytical Electron Microscopy Workshop held in Cornell, ten years ago, four topics of major concern were identified in the session devoted to thin film X-ray microanalysis. They related to spatial resolution, to detection and reduction of spectral features generated by spurious signals incident on the specimen, to benefits that might accrue
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High resolution x-ray emission spectroscopy

AIP Conference Proceedings, 2001
A Johann-type single crystal spectrometer (2R=1500 mm) with a high resolution was equipped in BL01B1 in Spring-8. This has an excitation source over an energy range more than 3.1 keV for a core level investigation and material sciences. The experimental results with fluorescence x-ray spectra on copper and tungsten are first time presented here.
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Scattered X-Rays as Internal Standards in X-Ray Emission Spectroscopy

Analytical Chemistry, 1958
Instrumental variables and absorption effects in x-ray emission spectroscopy are corrected for by use of scattering radiation of the sample as an internal standard. Correction is complete or partial depending upon the immediate analytical problem. (auth)
George. Andermann, J. W. Kemp
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Current problems in X-ray emission spectroscopy

Ultramicroscopy, 1989
Various problems that limit X-ray analysis in the analytical electron microscope are reviewed. Major emphasis is given to the trade-off between minimum mass fraction and spatial resolution. New developments such as high-brightness electron guns, new X-ray spectrometers and clean high-vacuum analysis conditions will lead to major improvements in the ...
Joseph I. Goldstein, David B. Williams, Charles E. Lyman   +2 more
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Polarization dependence of X-ray emission spectroscopy

Journal of Electron Spectroscopy and Related Phenomena, 2004
Abstract The polarization dependence of X-ray emission spectroscopy (XES) is studied on the angle dependence of incident and emitted X-ray. The Kramers–Heisenberg formula is employed to describe the optical process. It is shown that the quantum mechanical interference effect is directly observable in magnetic circular dichroism (MCD) spectra in a ...
H. Ogasawara, K. Fukui, M. Matsubara
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Counting Strategy in X-Ray Emission Spectroscopy

Applied Spectroscopy, 1969
Equations are presented for obtaining greatest precision from available counting time, and minimum counting time for a specified precision in quantitative x-ray spectroscopic analyses. The equations are derived for analytical situations involving determination of the net peak intensity of a line above background and the ratio of the net peak ...
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Integrative oncology: Addressing the global challenges of cancer prevention and treatment

Ca-A Cancer Journal for Clinicians, 2022
Jun J Mao,, Msce, Lorenzo Cohen, Karen M Mustian   +2 more
exaly  

X-ray Emission Spectroscopy in Pharmaceutical Analysis

Journal of Pharmaceutical Sciences, 1963
G J, PAPARIELLO, W J, MADER
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X-Ray Emission Spectroscopy, Methods*

1999
George N. Dolenko, Oleg Kh Poleshchuk, Jolanta N. Latosińska   +2 more
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