Results 251 to 260 of about 7,078,356 (296)

X-Ray Fluorescence Spectrometry

2010
The article contains sections titled: 1. Introduction 2. Properties of X Rays 3. Interaction of X Rays with Matter 3.1. Photoelectric Effect 3.2. Scattered Radiation 4. Attenuation of X Rays in Matter 5. Penetration of X Rays 6. Instrumentation 6.1. X-Ray Sources 6.2. X-Ray Detectors 6.3. Geometrical Considerations 6.4.
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Atomic Spectrometry Update—Atomic Mass Spectrometry and X-Ray Fluorescence Spectrometry

J. Anal. At. Spectrom., 1995
The large number of papers covered in this year's review emphasizes the strong developments which continue in atomic mass and X-ray fluorescence spectrometries. Although much of the effort is aimed at improving existing technology and methodology, new and innovative instrumentation is also being developed in a number of fields.
Bacon, J.R., Chenery, S.R.N., Ellis, A.T., Fisher, A., McMahon, A.W., Potts, P.J., Williams, J.G.   +6 more
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Atomic Spectrometry Update—Inorganic Mass Spectrometry and X-ray Fluorescence Spectrometry

J. Anal. At. Spectrom., 1988
This year's Update includes an extended mass spectrometry section based on full abstracts and covering fully this extensive area of analysis. The newly introduced instrumentation for Glow discharge MS and the combined MS techniques are particularly notable this year. The ICP-MS section continues to grow in line with the increasing number of instruments
Jeffrey R. Bacon, Andrew T. Ellis, John G. Williams   +2 more
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Progress in laboratory grazing emission x-ray fluorescence spectrometry

X-Ray Spectrometry, 1999
Recently, grazing emission x-ray fluorescence (GEXRF) spectrometry, also referred to as grazing exit spectrometry, attained a special position in the field of XRF. The technique exploits the advantages of the total-reflection phenomenon as is done in the related total-reflection XRF technique.
Claes, Martine, de Bokx, Pieter, Van Grieken, René   +2 more
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Elemental analysis with x-ray fluorescence spectrometry

SPIE Proceedings, 2012
Elemental analysis by means of X-ray fluorescence (XRF) spectrometry is based on the element-specific electromagnetic radiation induced as a consequence of inner-shell ionization. XRF spectrometry is ideal for the direct analysis of solid samples, but can also investigate fluid samples.
Peter Lienemann, Davide Bleiner
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X-ray Fluorescence Spectrometry

This chapter covers the use of XRF spectrometry. A very brief introduction to the theory is given followed by a summary of the capabilities of wavelength and energy dispersive instruments. A discussion of physical and spectral interferences is then provided. The largest section of the chapter covers the methods of sample preparation.
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Determination of Beryllium by Using X-ray Fluorescence Spectrometry

Analytical Chemistry, 2008
X-ray fluorescence spectrometry method is subject to certain difficulties and inconveniences for the elements having the atomic number 9 or less. These difficulties become progressively more severe as the atomic number decreases, and are quite serious for beryllium, which is practically indeterminable directly by XRF.
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X-ray fluorescence spectrometry

J. Anal. At. Spectrom., 1999
Philip J. Potts, Andrew T. Ellis, Peter Kregsamer, Christina Streli, Margaret West, Peter Wobrauschek   +5 more
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Portable X-ray Fluorescence Spectrometry

2008
Portable X-ray fluorescence (PXRF) instrumentation has some unique analytical capabilities for the in situ analysis of samples in the field. These capabilities have been extended in recent years by the continuing development of solid state detectors, surface mounted electronics, digital signal processing technology, Li-ion batteries combined with a ...
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Dilution method in x-ray fluorescence spectrometry

Microchemical Journal, 1978
Abstract The Lachance-Traill method was modified to a dilution method that retains all the advantages of the original method plus it enables the determination of as many elements as one pleases and is far simpler mathematically. The method had been tested with determination of copper, molybdenum, zinc, and arsenic in copper intermediates.
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