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Instrumentation for Total Reflection Fluorescent X-Ray Spectrometry
Advances in X-ray Analysis, 1991AbstractThis article describes the instrumentation for a total reflection fluorescent x-ray spectrometer. The reflecting intensity and the angular divergence were studied with respect to various kinds of monochromators. Using silicon wafers, the angular divergence effect of the incident beam, surface roughness influences and the smoothing of background
Tomoya Arai, Tadashi Utaka
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Spectrometry of the photon beam from an X-ray tube by X-ray fluorescence
Nuclear Instruments and Methods in Physics Research, 1984Abstract A method to perform the measurement of photon beam spectra from X-ray tubes is described. It consists of exciting the fluorescence of elements with their K-binding energies lying within the energetic range of the bremsstrahlung spectrum, using the tube photon beam, and a 241 Am excitation source as a reference, to normalize individual ...
A. López-Fraguas+4 more
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Dilution method in x-ray fluorescence spectrometry
Microchemical Journal, 1978Abstract The Lachance-Traill method was modified to a dilution method that retains all the advantages of the original method plus it enables the determination of as many elements as one pleases and is far simpler mathematically. The method had been tested with determination of copper, molybdenum, zinc, and arsenic in copper intermediates.
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Analysis of waste water by x‐ray fluorescence spectrometry
X-Ray Spectrometry, 2002AbstractMethods of specimen preparation for the x‐ray fluorescence analysis of water are described. For direct determination of impurities in waste water samples, quasi‐solid specimens based on gelatin (agar) are proposed. Such specimens may also be used after extractive enrichment of impurities and their re‐extraction into the aqueous phase.
L. P. Eksperiandova+2 more
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Progress in laboratory grazing emission x-ray fluorescence spectrometry
X-Ray Spectrometry, 1999Recently, grazing emission x-ray fluorescence (GEXRF) spectrometry, also referred to as grazing exit spectrometry, attained a special position in the field of XRF. The technique exploits the advantages of the total-reflection phenomenon as is done in the related total-reflection XRF technique.
Claes, Martine+2 more
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X‐ray fluorescence spectrometry in Dar es Salaam
X-Ray Spectrometry, 2005AbstractEnergy‐dispersive x‐ray fluorescence (EDXRF) analysis has been established at the University of Dar es Salaam, Faculty of Science, Department of Physics. Calibration was conducted using thin films from Micromatter (USA) for secondary target XRF.
John W. Kondoro, Yusuf I. A. Koleleni
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Recent Advances in Portable X‐Ray Fluorescence Spectrometry
Applied Spectroscopy Reviews, 2004Abstract X‐ray fluorescence (XRF) spectrometry is a nondestructive, rapid, simultaneous multi‐element analytical methodology for solid or liquid samples. Its applications are broad and XRF spectra cover most elements, with a dynamic range from 100% down to the µg/g level.
Bradley T. Jones, Xiandeng Hou, Yihua He
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Multielement x‐ray fluorescence spectrometry of solutions
X-Ray Spectrometry, 1980AbstractThe theoretical relationships between fluorescence intensity and concentration have been used for the calculation of correction constants of the Lachance‐‐Traill and Rasberry‐‐Heinrich equation for systems of solutions. The constants have also been calculated by means of the multivariate least‐‐squares method.
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Analysis of plant material by X‐ray fluorescence spectrometry
X-Ray Spectrometry, 1977AbstractTo get a better understanding of chemical changes accompanying reproduction, maturation and senescence of plants, plant samples collected in various marshes were analysed by X‐ray fluorescence spectrometry for Na, Mg, Al, Si, P, K, Ca, Ti, Mn and Fe with sufficiently accurate results.
O. Mudroch, A. Mudroch
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Determination of Beryllium by Using X-ray Fluorescence Spectrometry
Analytical Chemistry, 2008X-ray fluorescence spectrometry method is subject to certain difficulties and inconveniences for the elements having the atomic number 9 or less. These difficulties become progressively more severe as the atomic number decreases, and are quite serious for beryllium, which is practically indeterminable directly by XRF.
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