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X-ray diffraction phase analysis of the crystalline phase of polytetrafluoroethylene

Crystallography Reports, 2010
Samples of ultradispersed polytetrafluoroethylene, which were prepared with the use of different technological approaches, were studied by X-ray diffraction. The samples were found to belong to the monoclinic system. For some samples, basal reflections, which can be related to paraffins, were found for the first time. This indicates that polymer chains
Yu. A. Lebedev   +4 more
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The doping method in quantitative X-ray diffraction phase analysis

Journal of Applied Crystallography, 1979
The doping method in quantitative X-ray diffraction phase analysis is described. The method involves the addition to the investigated system of known amounts of the components, the weight fractions of which are to be simultaneously determined. The weight fraction of a component is related to the intensities diffracted by that component and by any non ...
Gržeta, Biserka, Popović, Stanko
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The application of cluster analysis in X-ray diffraction phase analysis

Journal of Applied Crystallography, 1992
This paper proposes a method using cluster analysis to classify X-ray diffraction lines of a multiphase mixture into different phases. This classification of lines is useful in both qualitative and quantitative phase analysis. An example of a three-phase mixture is given to illustrate this method.
B. Liao, J. Chen
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Quantitative Phase Analysis in Titanium by X-Ray Diffraction

Advances in X-ray Analysis, 1957
AbstractIn view of present difficulties encountered in met alio graphic methods of phase analysis of titanium and its alloys, the possibility of utilizing integrated X-ray intensities for phase analysis was investigated. Power Formula variables were calculated for titanium, and relative areas of three alpha and one beta peak were determined. Recorded X-
Ralph H. Hiltz, Stanley L. Lopata
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Regularization of methods of a standardless X-ray phase analysis

Journal of Structural Chemistry, 2011
The Tikhonov regularization of the reference intensity ratio (RIR) method integrated within the information retrieval system of X-ray phase analysis together with the method of cluster phase identification is reported. The possibilities of the methods are discussed by the example of the X-ray phase analysis of test mixtures from Round Robin on QPA held
I. S. Yakimov   +4 more
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X-Ray Diffraction Phase Analysis Using Microcomputers

Advances in X-ray Analysis, 1981
X-ray diffraction to determine the phases present in complex specimens generally proceeds by acquiring a pattern of D-spacings and intensities from the sample, which is then compared to patterns from a series of known or standard phases. The process of searching through large data bases to identify matches is too time consuming for manual methods, and ...
T. M. Hare, J. C. Russ, M. J. Lanzo
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Mössbauer and X-ray phase analysis of carburized steel

Hyperfine Interactions, 1994
57Fe backscattering Mossbauer phase analysis of the ASTM A295-70 type chromium bearing steel gas was performed for samples with varying phase composition achieved by gas carburization up to 3 wt% C followed by standard hardening, i.e. austenitizing and quenching procedures.
T. Zemčík   +3 more
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Extraction and X-ray analysis of phases in aluminium alloys

Journal of Materials Science, 1978
The extraction of precipitates and second phase insoluble intermetallic or metalloid compounds from three commerical aluminium alloys was achieved by anodic dissolution of the aluminium alloy matrix in a methanolic electrolyte containing benzoic acid, oxine and chloroform.
S. F. Cogan   +4 more
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Phase space analysis applied to x-ray optics

Nuclear Instruments and Methods, 1978
Abstract The unique properties of synchrotron radiation have been well documented in the literature 1−5 ). These properties are the tunability over wide photon energy ranges which are inaccessible with othersourrces, high intensity, high degree of polarization and excellent collimation. One aspect of synchrotron radiation which has not been discussed
P. Pianetta, I. Lindau
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Quantitative X-ray phase analysis of surface layers

Journal of Applied Crystallography, 1984
The proposed method is aimed at the analysis of phase distribution in thin surface layers comparable to the penetration depth of X-rays. The phase distribution is modelled mathematically and the parameters of the distribution are evaluated from diffraction data taken for various peaks and with various radiations.
L. S. Zevin, P. Rozenak, D. Eliezer
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